1999
DOI: 10.1063/1.369103
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Magnetostriction in spin valves

Abstract: We report an accurate method for the measurement of the saturation magnetostriction λs of thin conducting ferromagnetic films using spin valve structures. We describe an alternative to the cantilever beam method, called the bending method, which utilizes the inverse magnetostrictive effect. Typical soft ferromagnetic films exhibit hysteretic magnetization loops, which make the measurements of the magnetoelastic energy (hence λs) imprecise or erroneous. We show how to resolve the hysteresis problem by applicati… Show more

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Cited by 39 publications
(26 citation statements)
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“…Magnetostriction effect has long been observed and analyzed, and so has its reverse effect that we actually use [2,3]. Here we present a simple derivation for an equation relating the gauge factor and the magnetoresistive properties of the SDT devices.…”
Section: Iii3 Strain Sensitivity Analysismentioning
confidence: 99%
“…Magnetostriction effect has long been observed and analyzed, and so has its reverse effect that we actually use [2,3]. Here we present a simple derivation for an equation relating the gauge factor and the magnetoresistive properties of the SDT devices.…”
Section: Iii3 Strain Sensitivity Analysismentioning
confidence: 99%
“…The Currently, GMR sensor devices are fabricated on rigid inorganic substrates like oxidized silicon (SiOx) wafers or glass. Although there is some activity toward straining of GMR structures grown on this kind of substrates by means of bending to study their magnetoelastic behavior 98,99 , the maximal achievable deformation of a few ‰ is far too low for any applications within the concept of stretchable electronics. In order to be able to elastically stretch GMR sensor elements to much higher levels of deformation, the magnetic nanomembranes should be situated on an elastomeric substrate.…”
Section: Technological Approachmentioning
confidence: 99%
“…Deformations of GMR sensoric structures were originally applied on conventional SiOx wafer or glass supports to study effects of inverse magnetostriction on the magnetoelectric characteristics 98 and eventually use those for highly sensitive strain gauges 99,105 . Although the supports used in these studies are considered rigid, they allow for a small amount of bending deformation, which is translated to the functional magnetic layers on the outer surface as a tensile deformation (bending strain) of the order of about 0.1%.…”
Section: State-of-the-artmentioning
confidence: 99%
“…23 Wafer scale CMOS circuitry on ultra-thin 6 nm Si membranes obtained by controlled spalling technology has been shown to be fully functional at bending radii of 6.3 mm. 24 Bending tests of GMR sensorics prepared on 330-380 lm thick SiO x wafers 25,26 or 250 lm glass slides 27 were carried out to study effects of inverse magnetostriction on the magnetoelectric characteristics 27 and eventually to use those for highly sensitive strain gauges. 25,26 The used thick supports allow bending radii above 100 mm only.…”
mentioning
confidence: 99%