1996
DOI: 10.1016/s0304-8853(96)00292-2
|View full text |Cite
|
Sign up to set email alerts
|

Magneto-optical measurements of magnetization reversal in nanometer scale sputtered Fe thin films

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1
1
1

Citation Types

1
4
0
1

Year Published

1997
1997
2020
2020

Publication Types

Select...
9

Relationship

2
7

Authors

Journals

citations
Cited by 25 publications
(6 citation statements)
references
References 22 publications
1
4
0
1
Order By: Relevance
“…(A6) shows the difference in up-and down-spin magnetoelectrochemical potentials to decay over the length sf from an interface -this length is called the "spin-flip" or "spin-diffusion" length (and sometimes referred to as the "SDL"). The length sf may be measurable by employing the Magneto-Optical Kerr Effect 35,36 or the Inverse Spin Hall Effect, 37 or may be derived using GMR measurements and theory. 38 Substitution of Eq.…”
Section: Appendix A: Details Of the Spin Modementioning
confidence: 99%
“…(A6) shows the difference in up-and down-spin magnetoelectrochemical potentials to decay over the length sf from an interface -this length is called the "spin-flip" or "spin-diffusion" length (and sometimes referred to as the "SDL"). The length sf may be measurable by employing the Magneto-Optical Kerr Effect 35,36 or the Inverse Spin Hall Effect, 37 or may be derived using GMR measurements and theory. 38 Substitution of Eq.…”
Section: Appendix A: Details Of the Spin Modementioning
confidence: 99%
“…A semiconductor laser working at a wavelength of 670 nm was used as a light source. The measurements of the magneto-optical angles (the Kerr rotation y K measured without retarder and the Kerr ellipticity K detected using quarter-wave retarder) were obtained for s-and ppolarized incident light [9]. All measurements were carried out in open air and at room temperature.…”
Section: Methodsmentioning
confidence: 99%
“…Глубина проникновения света в тонкие металлические пленки составляет примерно 50 nm [14], а информативная глубина проникновения света для метода МОКЕ составляет половину от полной глубины проникновения света [15]. Сигнал магнитооптического эффекта зависит линейно от толщины ферромагнитной пленки [16,17] при ее толщине < 10 nm. Суммарная толщина исследуемой гетероструктуры составляет 9.7 nm.…”
Section: многослойная структураunclassified