2010
DOI: 10.1016/j.jmmm.2010.03.008
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Magnetization reversal dynamics in Au/Co/Au(111) ultrathin films: Effect of roughness of the buffer layer

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Cited by 10 publications
(7 citation statements)
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“…This decrease is in contrast to what is usually observed in Au/Co/Au systems with cobalt thicknesses in the same range as the ones studied here, where coercivity generally increases with decrease in the thickness of the cobalt layer [10,11]. The decrease in the coercivity in our samples is probably due to the effect of the morphology of the gold buffer layer [6]. The coercivity has a nucleation or wall propagation origin, but being also usually correlated with the anisotropy let us discuss of the anisotropy of our samples.…”
Section: Coercivity and Anisotropycontrasting
confidence: 91%
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“…This decrease is in contrast to what is usually observed in Au/Co/Au systems with cobalt thicknesses in the same range as the ones studied here, where coercivity generally increases with decrease in the thickness of the cobalt layer [10,11]. The decrease in the coercivity in our samples is probably due to the effect of the morphology of the gold buffer layer [6]. The coercivity has a nucleation or wall propagation origin, but being also usually correlated with the anisotropy let us discuss of the anisotropy of our samples.…”
Section: Coercivity and Anisotropycontrasting
confidence: 91%
“…The rms roughness of the buffer layer is estimated to be 0.316 nm. We showed previously that the average of the slopes on rough surfaces can be obtained in two different ways [6]. This average slope angle (g a ) is estimated to be approximately 91 (g a E91) along the line traced in Fig.…”
Section: Samples and Morphological Characterizations Of The Buffer Layermentioning
confidence: 89%
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“…1 schematically illustrated together with two direct consequences of this approach. First, the different bottom Pt thicknesses, grown directly on the substrate, result in a different interface quality with the Co layer, 22,23 schematically illustrated by the different colors at the Pt/Co interface. Second, when a current is passed through such a tri-layer stack a different current density distribution is expected.…”
mentioning
confidence: 99%