1997
DOI: 10.1063/1.366169
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Magnetization and flux creep in thin YBa2Cu3O7−δ films of various thickness

Abstract: We report on the thickness dependence of the irreversible magnetization in superconducting Y1Ba2Cu3O7−δ films of thickness 350–3000 Å. Our results reveal a nonmonotonous dependence of the persistent current density j on the film thickness, which is interpreted in terms of surface pinning and variations in the surface microstructure. Measurements of the time dependence of j show that under certain conditions relaxation curves of samples of different thickness cross each other, i.e., the sample with initially la… Show more

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Cited by 18 publications
(17 citation statements)
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“…This dependence is very similar to that measured by Jooss et al 13 Other authors also report the increase of j as function of film thickness d, but with a maximum at dϷ100 nm followed by a much more rapid drop of j. 15,36,37 Proposed explanations 15,13 have been the increase of the effective penetration depth from ab towards 2 ab 2 /d for films thinner than 2 ab , 38 a bad film morphology and illconnected islands for dϽ100 nm, 36 and differences in defect structure between the thinner and the thicker films. 37 We note that the fact that films from different sources display maximum j for widely different film thicknesses, 100 nm and 250 nm, respectively, exclude that the relative magnitude of d and ab is at the origin of the increase of j(d).…”
Section: Discussionsupporting
confidence: 80%
“…This dependence is very similar to that measured by Jooss et al 13 Other authors also report the increase of j as function of film thickness d, but with a maximum at dϷ100 nm followed by a much more rapid drop of j. 15,36,37 Proposed explanations 15,13 have been the increase of the effective penetration depth from ab towards 2 ab 2 /d for films thinner than 2 ab , 38 a bad film morphology and illconnected islands for dϽ100 nm, 36 and differences in defect structure between the thinner and the thicker films. 37 We note that the fact that films from different sources display maximum j for widely different film thicknesses, 100 nm and 250 nm, respectively, exclude that the relative magnitude of d and ab is at the origin of the increase of j(d).…”
Section: Discussionsupporting
confidence: 80%
“…7͒ observed at T ഛ 77 K by other groups. This thickness effect seems to be inherently determined by the lower activation energy associated with thinner films, which is confirmed by the observation of considerable increase of relaxation rate dM / dt in the thinner YBCO films at T ജ 70 K. 29 Although a quantitative comparison requires more detailed experimental studies, this experimental observation of J c -t curves agrees well qualitatively with the theoretical simulation of J c -t curves by considering the TAFM effect on the original CP model. 30 If the deviation of J c -t from the J c ϰ t −1/2 curve is caused mainly by TAFM, much enhanced effect is anticipated in the applied H since it reduces pinning potential and facilitates TAFM.…”
supporting
confidence: 77%
“…However, when data are taken in a series of films or foils of variable thickness t, J c ͑defined as I c /Wt, where W is the foil width͒ is generally observed to increase with decreasing t. More precisely, Joiner and Kuhl 6 reported an exact linear dependence J c vs 1/t in PbBi foils. A similar behavior is retrieved in YBCO films, when the thickness is larger than about 2 ab , 7 for example, J c tϳ10 A/cm in the low-field limit at 70 K. 8 The fact that J c tϭconst in samples otherwise prepared in the same way could be immediately and most simply interpreted by stating that K c ϭI c /2Wϭconst.…”
Section: Introductionmentioning
confidence: 62%