Magnetically Enhanced Thin‐Film Coarsening by a Magnetic XPFC Model Allowing to Decouple Magnetic Anisotropy and Magnetostriction

Abstract

External magnetic fields provide a macroscopic control mechanism to influence the microstructure of polycrystalline materials. Herein, the influence of strong magnetic fields on grain growth in thin films is modeled with a magnetic extended phase field crystal model. The magneto–structural effects are incorporated into the correlation function in reciprocal space. With this approach, magnetic anisotropy, magnetostriction, and mobility of grain boundary can be controlled and a variety of geometrical and topological properties consistent with experimental results can be determined.