1990
DOI: 10.1147/rd.346.0884
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Magnetic thin films in recording technology

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Cited by 56 publications
(17 citation statements)
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“…As mentioned above, the initial increase in H C without biasing at t AF = 3 nm indicates that AF order is already established and that certain fraction of frustrated spins in the FeMn rotates reversibly with the FM magnetization during the measurement of a hysteresis loop. The increase in H C close to the AF thickness for onset of biasing could alternatively be attributed to imperfections in the AF, e.g., embedded impurities or crystal defects, irreversible transitions of grains, 38 to pinning the partial wall formed in the AF, 36 interfacial magnetic frustration, 39 or to regions with locally different blocking temperatures 40 depending on t AF . Despite that FeMn is already behaving as an AF, at t AF = 3 nm it is still not capable to accommodate a planar domain wall, resulting in zero field shift.…”
Section: Fig 3 ͑Color Online͒ Af Thickness Dependencies Of the Expementioning
confidence: 99%
“…As mentioned above, the initial increase in H C without biasing at t AF = 3 nm indicates that AF order is already established and that certain fraction of frustrated spins in the FeMn rotates reversibly with the FM magnetization during the measurement of a hysteresis loop. The increase in H C close to the AF thickness for onset of biasing could alternatively be attributed to imperfections in the AF, e.g., embedded impurities or crystal defects, irreversible transitions of grains, 38 to pinning the partial wall formed in the AF, 36 interfacial magnetic frustration, 39 or to regions with locally different blocking temperatures 40 depending on t AF . Despite that FeMn is already behaving as an AF, at t AF = 3 nm it is still not capable to accommodate a planar domain wall, resulting in zero field shift.…”
Section: Fig 3 ͑Color Online͒ Af Thickness Dependencies Of the Expementioning
confidence: 99%
“…1 Recently, the interest in this effect revived, 2-5 due its application in magneto-resistive sensors. 6 Still, the microscopic origin of this effect is poorly understood. In the extensively studied Ni-Fe/Fe-Mn system the magnitude of the loop shift or bias field, H eb , is smaller by more than two orders of magnitude than calculated according to the original interpretation.…”
Section: Introductionmentioning
confidence: 99%
“…In the extensively studied Ni-Fe/Fe-Mn system the magnitude of the loop shift or bias field, H eb , is smaller by more than two orders of magnitude than calculated according to the original interpretation. 4,6 In this interpretation the biasing is caused by a unidirectional anisotropy arising from nearest-neighbor exchange coupling across a perfectly flat interface which is magnetically uncompensated at the AF side. 1 If the ferromagnet is made single domain by a large applied field above T N of the AF component, field cooling through T N results in alignment of the AF interface spins to the aligned F interface spins.…”
Section: Introductionmentioning
confidence: 99%
“…Noise property of thin film media continues to be an active area of [16,17,18]. Several approaches can effectively reduce the transition noise in Co-alloy recording media.…”
Section: Transition Noise and Suchmentioning
confidence: 99%