Magnetic, structural and electrical properties of ordered and disordered Co50Fe50 films

Chen, Y.T.; Jen, S. U.; Yao, Y. D.; Wu, Jenn‐Ming; Hwang, G. H.; Tsai, Tsung‐Lin; Chang, Y. C.; Sun, Andy

doi:10.1016/j.jmmm.2006.01.224

Cited by 10 publications

(4 citation statements)

References 4 publications

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“…The change in the coercivity with T m of the free layer in spin valve is nonmonotonic, and the maximum value appears at T m = 225 • C. This phenomenon has also been observed in exchange-coupled NiFe [27] and CoFe films. [28,29] T m (C) When the temperature is lower than 225 • C, both T m and H cf increase, mainly because of the phase transition of the CoFe free layer. In general, when CoFe is deposited on the Cu layer, an fcc structure forms easily.…”

Section: Resultsmentioning

confidence: 99%

Influence of temperature on thermal relaxation of exchange bias field in CoFe/Cu/CoFe/IrMn spin valve*

Qi¹,

Yang²,

Duan³

et al. 2021

Chinese Phys. B

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A multilayered spin valve film with a structure of Ta (5 nm)/Co 75 Fe 25 (5 nm)/Cu(2.5 nm)/Co 75 Fe 25 (5 nm)/Ir 20 Mn 80 (12 nm)/Ta(8 nm) is prepared by the high-vacuum direct current (DC) magnetron sputtering. The effect of temperature on the spin valve structure and the magnetic properties are studied by x-ray diffraction (XRD), atomic force microscopy (AFM), and vibrating sample magnetometry. The effect of temperature on the exchange bias field thermomagnetic properties of multilayered spin valve is studied by the residence time of samples in a reverse saturation field. The results show that as the temperature increases, the IrMn (111) texture weakens, surface/interface roughness increases, and the exchange bias field decreases. Below 200 • C, the exchange bias field decreases with the residence time increasing, and at the beginning of the negative saturation field, the exchange bias field H ex decreases first quickly and then slowly gradually. When the temperature is greater than 200 • C, the exchange bias field is unchanged with the residence time increasing.

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Section: Resultsmentioning

confidence: 99%

Influence of temperature on thermal relaxation of exchange bias field in CoFe/Cu/CoFe/IrMn spin valve*

Qi¹,

Yang²,

Duan³

et al. 2021

Chinese Phys. B

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“…4. The temperature coefficient of resistance (TCR) value is defined as TCR =(1/R)/(∆R/∆T), where R is the electrical resistance at temperature T, and ∆R is the resistance difference due to the temperature change ∆T [8]. According to the change of TCR on the reduced electrical resistivity temperature curve, the two values dependent on glass transition range are found [9].…”

Section: Resultsmentioning

confidence: 99%

Structure and Properties of the Melt-Spun Fe41Ni39P10Si5B5 Alloy Heat Treated at Elevated Temperatures

Ziewiec

Prusik

2010

SSP

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The aim of the work was to provide information on structure development and change of properties at elevated temperatures in Fe41Ni39P10Si5B5 amorphous alloy. The alloy was characterized by X-ray diffraction. The changes of properties were characterized with use of dynamic mechanical thermal analysis (DMTA) and the resistivity measurements at elevated temperatures. The microstructure of the melt spun ribbon was investigated with use of transmission electron microscope (TEM) at different stages of phase transformations after heating to different temperatures. The initially amorphous structure undergoes phase transformations due to glass transition and crystallization of the alloy. The appearance of glass transition region results in decrease of storage modulus and in a reversible change of temperature coefficient of resistivity (TCR). The phases are characterized with use of TEM. The crystallization was found to have the two stages. Formation of bcc crystals and Ni12P5 is followed by transformation of the products into fcc crystals and Ni3P. Temporary changes of the storage modulus and elongation of the sample suggest formation of hard phases during crystallization.

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“…This explains the observed improvement of the magnetic properties when thin films and devices based on CoFe are post-annealed at this temperature. 14 …”

Section: -2mentioning

confidence: 99%

Structure determination of thin CoFe films by anomalous x-ray diffraction

Gloskovskii

Stryganyuk

Ouardi

et al. 2012

Journal of Applied Physics

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Magnetic, structural and electrical properties of ordered and disordered Co50Fe50 films

Cited by 10 publications

References 4 publications

Influence of temperature on thermal relaxation of exchange bias field in CoFe/Cu/CoFe/IrMn spin valve*

Influence of temperature on thermal relaxation of exchange bias field in CoFe/Cu/CoFe/IrMn spin valve*

Structure and Properties of the Melt-Spun Fe<sub>41</sub>Ni<sub>39</sub>P<sub>10</sub>Si<sub>5</sub>B<sub>5</sub> Alloy Heat Treated at Elevated Temperatures

Structure determination of thin CoFe films by anomalous x-ray diffraction

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