2008
DOI: 10.1103/physrevb.78.134423
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Magnetic resonant x-ray diffraction study of europium telluride

Abstract: Here we use magnetic resonant x-ray diffraction to study the magnetic order in a 1.5 m EuTe film grown on ͑111͒ BaF 2 by molecular-beam epitaxy. At Eu L II and L III absorption edges, a resonant enhancement of more than two orders was observed for the → Ј diffracted intensity at half-order reciprocal-lattice points, consistent with the magnetic character of the scattering. We studied the evolution of the ͑ 2 ͒ magnetic reflection with temperature. When heating toward the Neel temperature ͑T N ͒, the integrated… Show more

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Cited by 19 publications
(18 citation statements)
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“…However, our target was to compare the theory with experiments performed on EuTe thick layer samples ͑about 1 m thickness͒ grown by molecular-beam epitaxy ͑MBE͒, and therefore only a single T domain parallel to the ͑111͒ substrate was included in the calculations, because the other domains of equivalent energy present in isotropic samples are suppressed in MBE samples due to residual strains. 25 Within the existing T domain, all three S domains are found experimentally to be present in samples grown by MBE, 26 thus three S domains were included in the calculations.…”
Section: Resultsmentioning
confidence: 99%
“…However, our target was to compare the theory with experiments performed on EuTe thick layer samples ͑about 1 m thickness͒ grown by molecular-beam epitaxy ͑MBE͒, and therefore only a single T domain parallel to the ͑111͒ substrate was included in the calculations, because the other domains of equivalent energy present in isotropic samples are suppressed in MBE samples due to residual strains. 25 Within the existing T domain, all three S domains are found experimentally to be present in samples grown by MBE, 26 thus three S domains were included in the calculations.…”
Section: Resultsmentioning
confidence: 99%
“…The samples were grown by molecular beam epitaxy on BaF 2 substrates [36]. The thickness of the epitaxial layers was in the range 1-4.2 μm.…”
Section: Methodsmentioning
confidence: 99%
“…State of the art for EuX technology is that MBE grown epilayers have much higher structural and optical quality compared to bulk single crystals. 59,88 For higher order nonlinear optical effects the sample quality is a very important and often decisive factor. Requirements such as chemical stoichiometry and sample stability, structural and optical homogeneity, absence of impurities, partial SHG phase matching are easier fulfilled in MBE epilayers than in bulk crystals of EuX.…”
Section: Experimental Technique and Samplesmentioning
confidence: 99%