2020
DOI: 10.1007/s11182-020-01997-6
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Magnetic Properties of Permalloy Thin Film Edges

Abstract: ОСОБЕННОСТИ ПОВЕДЕНИЯ МАГНИТНЫХ ХАРАКТЕРИСТИК ВБЛИЗИ КРАЕВ ТОНКИХ ПЕРМАЛЛОЕВЫХ ПЛЕНОК *С помощью сканирующего спектрометра ферромагнитного резонанса (ФМР) изучены магнитные свойства нанокристаллических тонких пленок, изготовленных методом магнетронного распыления мишеней пермаллоя различного состава NixFe1-x (x=0.6-0.85). Проведен анализ особенностей поведения основных магнитных характеристик вблизи краев тонких пленок. Показано, что вблизи краев пленок не только значительно отклоняется величина поля одноосной… Show more

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Cited by 7 publications
(2 citation statements)
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“…We studied single-layer film structures of Fe x Ni 100−x synthesized at the Kirensky Institute of Physics [8]. The structures were fabricated in two ways: DC magnetron sputtering and thermal evaporation.…”
Section: Methodsmentioning
confidence: 99%
“…We studied single-layer film structures of Fe x Ni 100−x synthesized at the Kirensky Institute of Physics [8]. The structures were fabricated in two ways: DC magnetron sputtering and thermal evaporation.…”
Section: Methodsmentioning
confidence: 99%
“…The AMR effect is caused by the anisotropic scattering of 4s electrons in the exchanged split 3D orbitals [13]. This effect is obvious in PM films [14,15]. Therefore, a PM film made of 80% nickel and 20% iron is deposited on the device via magnetron sputtering.…”
Section: Sensing Devicementioning
confidence: 99%