Magnetic properties and switching field control of antiferromagnetically coupled recording media

Piramanayagam, S. N.; Wang, J.P.; Shi, X.; Pang, S. I.; Pock, C.K.; Shan, Z.S.; Chong, Tow Chong

doi:10.1109/20.950864

Cited by 25 publications

(11 citation statements)

References 6 publications

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“…A kink in the hysteresis loops is a common feature of AFC samples and it occurs due to the magnetization reversal in one of the layers (the layer with the lowest coercivity) [20][21][22]. The position of the kink (whether it occurs in the first or second quadrant) is determined by the coercivity (Hc) and the exchange field (Hex), as reported earlier [20][21][22].…”

Section: A Afc Samplesmentioning

confidence: 52%

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Effect of Carbon Overcoat Implantation on the Magnetic and Structural Properties of Perpendicular Recording Media

et al. 2015

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Carbon overcoats play an important role in the corrosion protection of recording media used in hard disk drive technology. Filtered cathodic vacuum arc (FCVA) has been studied in the past as a potential technology for depositing media overcoat. In order to achieve desired property of FCVA carbon, it is essential to apply a suitable bias voltage, which results in an energetic carbon deposition on the magnetic layer of the recording media. In this paper, we focus our attention on the implantation effects of energetic carbon on the magnetic and structural properties of recording media of two types; AFC and a single layer, in order to gain a meaningful insight on the implantation and its effect. The studies reveal that the energetic deposition alters the anisotropy constant of the magnetic layer, resulting in a reduction in the coercivity and thermal stability factor.

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Section: A Afc Samplesmentioning

confidence: 52%

“…The position of the kink (whether it occurs in the first or second quadrant) is determined by the coercivity (Hc) and the exchange field (Hex), as reported earlier [20][21][22]. The inset in figure 2 shows the minor loops of the two samples.…”

Section: A Afc Samplesmentioning

confidence: 62%

Effect of Carbon Overcoat Implantation on the Magnetic and Structural Properties of Perpendicular Recording Media

et al. 2015

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“…When only some regions have switched, the value of total magnetisation is lower than the saturation magnetisation, which accounts for the dip in total magnetisation. The extrinsic SFD, p(B) is known to be the derivative of the parallel component of magnetisation over the field at j¼0 [6,21]:…”

Section: Switching Field Distribution (Sfd)mentioning

confidence: 99%

Distribution of switching fields in thin films with uniaxial magnetic anisotropy

Yakovlev¹,

Tay²,

Tay³

et al. 2013

Journal of Magnetism and Magnetic Materials

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“…14 To achieve AFC after patterning, it is important to have higher antiferromagnetic (AF) exchange coupling field (H ex ) than the coercivity of stabiliz-ing layer. [12][13][14][15] Therefore, materials which show a high H ex are desired. A thin Co layer antiferromagnetically coupled to a magnetic layer with perpendicular anisotropy provides such a possibility.…”

mentioning

confidence: 99%

Origin of anomalously high exchange field in antiferromagnetically coupled magnetic structures: Spin reorientation versus interface anisotropy

Ranjbar

Piramanayagam

Wong

et al. 2011

Journal of Applied Physics

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A physical model of exchange bias in [ Pd / Co ] 5 / FeMn thin films with perpendicular anisotropyCorrelation between perpendicular exchange bias and magnetic anisotropy in IrMn ∕ [ Co ∕ Pt ] n and [ Pt ∕ Co ] n ∕ IrMn multilayers Magnetization reorientation from in-plane to perpendicular direction, observed in Co thin film coupled antiferromagnetically to high perpendicular magnetic anisotropy (Co/Pd) multilayers, is studied systematically for Co thickness ranging from 0 to 2.4 nm. The sample with 0.75 nm thick Co showed an exchange coupling field (H ex ) exceeding 15 kOe at room temperature and 17.2 kOe at 5 K. With an increase of Co thickness, H ex decreased as expected and beyond certain thickness, magnetization reorientation was not observed. Indeed, three regions were observed in the thickness dependence of magnetization of the thin layer; one in which the thin layer (in the thickness range up to 0.8 nm) had a perpendicular magnetic anisotropy due to interface effects and antiferromagnetic coupling, another in which the thin layer (0.9-1.2 nm) magnetization had no interface or crystallographic anisotropy but was reoriented in the perpendicular direction due to antiferromagnetic coupling, and the third (above 1.2 nm) in which the magnetization was in-plane. In addition, Hall effect measurements were carried out to observe the anomalous and planar Hall voltages and to quantify the perpendicular and in-plane components of magnetization. The sample with thicker Co layer (2.4 nm) showed an in-plane component of magnetization, whereas the sample with 0.75 nm Co showed no in-plane component. The high value of H ex observed in 0.75 nm Co samples can have important implications in spintronics and bit patterned media.

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Magnetic properties and switching field control of antiferromagnetically coupled recording media

Cited by 25 publications

References 6 publications

Effect of Carbon Overcoat Implantation on the Magnetic and Structural Properties of Perpendicular Recording Media

Effect of Carbon Overcoat Implantation on the Magnetic and Structural Properties of Perpendicular Recording Media

Distribution of switching fields in thin films with uniaxial magnetic anisotropy

Origin of anomalously high exchange field in antiferromagnetically coupled magnetic structures: Spin reorientation versus interface anisotropy

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