Abstract:CoFe/Si interfacial structures have been realised by electron beam evaporation of CoFe magnetic alloy on p-and n-Si substrates. These realised interfacial structures have been characterised from X-ray diffraction (XRD), atomic force microscopy (AFM), magnetic force microscopy (MFM) and magnetisation (M-H) characteristics. XRD data have shown the presence of CoFe (bcc phase) and b-FeSi 2 phases for CoFe/p-Si interfacial structures, whereas CoFe/n-Si interfacial structures have shown the presence of CoFe (bcc an… Show more
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