Magnetic moments in thin epitaxial Cr films on Fe(100)

Fuchs, Peter; Petrov, V. N.; Totland, K.; Landolt, M.

doi:10.1103/physrevb.54.9304

Cited by 18 publications

(9 citation statements)

References 20 publications

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“…17 Intermixing is expected to produce a Cr enriched interfacial region 8 AF coupled with the substrate, while surface roughening produces a reduced magnetization signal. A monotonic decay of the polarization signal was indeed observed in a number of past photoemission studies on the Cr/Fe(001) system, 30,31 and only very faint oscillations were detected in those cases where Fe-Cr intermixing was likely quenched. 32 In the present case, the clear onset of AF oscillations starting from the very interface (Figure 2) strongly supports an almost ideal layer-by-layer growth of the first Cr layers, enabled by the presence of oxygen.…”

Section: Experimental and Computational Methodsmentioning

confidence: 83%

“…Table 1 summarizes the results of our calculations. 30 and Victora et al 34 (labels a and b, respectively) and the results of Eichler et al 32 for the oxidized Cr(001) surface (label c).…”

Section: First-principles Resultsmentioning

confidence: 99%

“…close to the calculated one, was measured by in-situ magnetometry at 1 ML Cr coverage on Fe(001). 36 Indirect estimates by photoemission 30,31 and XMCD 37,38 resulted in a range of magnetic moments which are smaller than the calculated ones, but nevertheless larger (up to a value of about 1.8 ) than the bulk Cr magnetic moment. In line with previous results, we obtained with XMCD a maximum value of 1.7 for the Cr/Fe(001)-p(1×1)O system.…”

Section: Cr/fe ML Cr-p(1×1)o/fe Ml Cr-mentioning

confidence: 99%

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Magnetism in thin Cr films grown on Fe(001)-p(1×1)O: a spin-resolved investigation of single and multi-layers

et al. 2015

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We present a combined experimental and theoretical investigation of the magnetic behavior of ultra-thin Cr films grown on oxygen-passivated Fe(001)-p(1×1)O substrates. In all cases, oxygen floats on the metal/vacuum interface, where a monolayer-range oxide with peculiar electronic and structural characteristics is formed. Significant differences with previous experimental realizations of the Cr/Fe(001) heterostructure are thus introduced by the presence of oxygen. However, we show here that the magnetic behavior of our system is characterized by the same AF stacking at the Cr-Fe interface and by a layer-wise AF order in the Cr layer. In addition, we are able to circumvent the issue of chemical mixing at the Cr-Fe interface, characteristic of standard preparations.

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Section: Experimental and Computational Methodsmentioning

confidence: 83%

“…Table 1 summarizes the results of our calculations. 30 and Victora et al 34 (labels a and b, respectively) and the results of Eichler et al 32 for the oxidized Cr(001) surface (label c).…”

Section: First-principles Resultsmentioning

confidence: 99%

Section: Cr/fe ML Cr-p(1×1)o/fe Ml Cr-mentioning

confidence: 99%

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Magnetism in thin Cr films grown on Fe(001)-p(1×1)O: a spin-resolved investigation of single and multi-layers

et al. 2015

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“…Extraction of the overlayer signal thus requires modeling and subtraction of a generally spin-and energy-dependent background. 2,14 It is evident that this poses problems in cases like Cr on Fe, where interfacial alloying and largely different layer magnetizations are expected ͑in Refs. 3 and 8 Croverlayer induced features in the observed spin polarization amount to only a few percent of the underlying background polarization for the first few layers grown͒.…”

mentioning

confidence: 98%

Topmost layer magnetization of ultrathin Cr films on Fe(100) from proton-induced spin-polarized electron emission

2001

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The magnetic ordering of the topmost surface layer of ultrathin Cr films grown on Fe͑100͒ is studied via spin-polarized electron emission, excited by fast protons grazingly scattered from the film surface. We find that most electrons originate from the topmost layer. Based on simple assumptions we are able to deduce the layer-dependent magnetic moments from the observed spin polarization of electrons. We demonstrate that our method has a clearly smaller probing depth than conventional spin-polarized electron spectroscopies.

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“…The NIST group showed the oscillating magnetization of Cr surface, grown as a wedge on Fe whiskers [109]. In principle, one could use this to extract surface moments [110]. However, there are many parameters that enter into this model.…”

Section: Exchange Coupled Filmsmentioning

confidence: 98%

SEMPA Studies of Thin Films, Structures, and Exchange Coupled Layers

Oepen¹,

Hopster²

2005

NanoScience and Technology

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Scanning electron microscopy with polarization analysis (SEMPA) has developed into a powerful technique to study domains in ultrathin films. In this chapter, we discuss from a very general point of view the instrumental aspects of the method. Examples of thin film investigations are given that demonstrate unique features of SEMPA. New solutions around apparent limitations of the technique are presented at the end, i.e., analyzing samples with contaminated surfaces and imaging in external fields. IntroductionIn 1982, triggered by the investigations of the energy dependence of the spinpolarization of secondary electrons (SE), the idea emerged to use this effect in a microscope to image magnetic structures [1,2]. The combination of a conventional Scanning Electron Microscope (SEM) and a spin-polarization analyzer promised the potential of investigating magnetic microstructures with high spatial resolution. In 1984, the first spin-SEM was realized by Koike and coworkers [3], followed less than one year later by a microscope built at NIST [4]. The latter group introduced the abbreviation SEMPA, which stands for Scanning Electron Microscope with Polarization Analysis. We will use both acronyms interchangeably. The next instruments followed in Europe [5,6]. A sketch of SEMPA is given in Fig. 7.1. Due to the low depth of information, ultra-clean surfaces are essential, requiring ultrahigh vacuum (UHV) conditions. Since conventional SEMs usually do not operate in UHV, appropriate UHV-compatible columns (or guns) are rare and expensive. Hooked on is the detector system that consists of an electron optic and a spin-polarization analyzer. The optic has to focus the secondaries into the polarization analyzer. The most important feature of the electron optic is the acceptance angle for SE. It is extremely important that the optic collects electrons emitted in the full 2π solid angle.Several microscopes have been realized [7][8][9][10][11][12][13][14], and a few more have been proposed. Basically, all the systems look very similar. Some have attachments for surface

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Magnetic moments in thin epitaxial Cr films on Fe(100)

Cited by 18 publications

References 20 publications

Magnetism in thin Cr films grown on Fe(001)-p(1×1)O: a spin-resolved investigation of single and multi-layers

Magnetism in thin Cr films grown on Fe(001)-p(1×1)O: a spin-resolved investigation of single and multi-layers

Topmost layer magnetization of ultrathin Cr films on Fe(100) from proton-induced spin-polarized electron emission

SEMPA Studies of Thin Films, Structures, and Exchange Coupled Layers

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