2008
DOI: 10.1016/j.jmmm.2008.06.020
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Magnetic measurements in thin film specimens: Rejecting the contribution of the substrate

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Cited by 3 publications
(2 citation statements)
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“…where M and S are the magnetization and area of the sample, respectively, M Si and S Si are the magnetization and area of the pure Si substrate after cleaning chemically and M F is the magnetization of the film. Recently, Manios et al [29] have presented a reliable method that can be employed to directly reject the magnetic signal originating from the substrate. This is worthy of application to the cases where the deposited films have a low saturation magnetization (M S ) and a coercivity field, such as DMSs.…”
Section: Resultsmentioning
confidence: 99%
“…where M and S are the magnetization and area of the sample, respectively, M Si and S Si are the magnetization and area of the pure Si substrate after cleaning chemically and M F is the magnetization of the film. Recently, Manios et al [29] have presented a reliable method that can be employed to directly reject the magnetic signal originating from the substrate. This is worthy of application to the cases where the deposited films have a low saturation magnetization (M S ) and a coercivity field, such as DMSs.…”
Section: Resultsmentioning
confidence: 99%
“…An appropriate tube length was chosen to ensure that the tube extended well beyond the SQUID pick up coils during the measurement scan. In this way it was guaranteed that the tubes do not contribute to the measured magnetic moment, similar as described for long homogenous substrates by Manios et al [26].…”
Section: Methodsmentioning
confidence: 52%