Magnetic Imaging of Encapsulated Superparamagnetic Nanoparticles by Data Fusion of Magnetic Force Microscopy and Atomic Force Microscopy Signals for Correction of Topographic Crosstalk

Musyanovych, Anna; Thoelen, Ronald; Bomhard, Sibylle von; Fuhrmann, Marc

doi:10.3390/nano10122486

Cited by 10 publications

(5 citation statements)

References 22 publications

(29 reference statements)

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“…Both contributions are taken into account in the phase shift equation for lift mode measurements in table 2 left column, which gives the phase signal as a function of the topographic parameter and the dielectric constant. In this paper, we use a parabolic tip model as described in our previous works in order to calculate A eff [9,18]. Measurements in lift mode always include contributions from the topography, reducing the sensitivity to determine the dielectric contrast and even falsifying the results.…”

Section: Dielectric Contrast Of Non-planar Surface Structures In Lift...mentioning

confidence: 99%

“…In order to investigate the magnetism of nanoparticles, it was shown that while embedding the nanoparticles, the crosstalk due to capacitive coupling disappears [17]. In earlier work [18], an algorithm was developed to correct MFM lift mode data based on a correlation of the AFM signal and the MFM signal. A similar method was developed by van der Hofstadt for lift mode electrostatic force microscopy of non-planar samples [8].…”

Section: Introductionmentioning

confidence: 99%

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Determination of the dielectric constant of non-planar nanostructures and single nanoparticles by electrostatic force microscopy

Fuhrmann

Musyanovych²,

Thoelen³

et al. 2022

J. Phys. Commun.

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Electrostatic Force Microscopy has been proven to be a precise and versatile tool to perform quantitative measurements of the dielectric constant of thin film domains in the nanometer range. However, it is difficult to measure non-planar nanostructures because topographic crosstalk significantly contributes to the measured signal. This topographic crosstalk due to distance changes between tip and substrate measuring non-planar surface structures is still an ongoing issue in literature and falsifies measurements of the dielectric constant of nanostructures and nanoparticles. Tip and substrate form a capacitor based on the contact potential difference between the tip and substrate material. An increase of the distance between tip and substrate causes a repulsive force while a decrease causes an attractive force. Thus, measuring in the so-called lift mode scanning the surface in a second scan following the topography determined by a first scan leads to a mirroring of the non-planar surface structure in the electrostatic signal superimposing the signal from dielectric contrast. In this work we demonstrate that the topographic crosstalk can be avoided by using the linear mode instead of the lift mode. The use of the linear mode now allows the determination of the dielectric constant of single nanoparticles.

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Section: Dielectric Contrast Of Non-planar Surface Structures In Lift...mentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

Determination of the dielectric constant of non-planar nanostructures and single nanoparticles by electrostatic force microscopy

Fuhrmann

Musyanovych²,

Thoelen³

et al. 2022

J. Phys. Commun.

Self Cite

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show abstract

“…The use of coated or customized tips broadens the usage of the technique for different measurements such as magnetic, elastic, binding forces, and surface potentials. [79][80][81][82][83][84] Moreover, different modes of AFM contribute vital insights into the complexity of biomolecular interactions. [85] Also, this technique facilitates the detection of biomolecules or cells, which makes it a fast biodiagnostic equipment for diseases like cancer.…”

Section: Introductionmentioning

confidence: 99%

Envision and Appraisal of Biomolecules and Their Interactions through Scanning Probe Microscopy

et al. 2023

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Scanning probe microscopy (SPM) has gifted a novel eye to envision nanotechnology and nanoscience. The SPM technique involves a sharp probe that moves over the sample surface and leads to produce signals, which facilitates a deep understanding of the structural, electronic, vibrational, optical, magnetic, (bio) chemical, and mechanical properties of the material. Scanning tunneling microscopy (STM) and atomic force microscopy (AFM) measure various kinds of physical properties such as electric current, force, and capacitance. Moreover, AFM shows a prominent feature over STM that it accepts insulating surfaces and can work under physiological conditions, making it feasible to study biological molecules. Herein, the SPM approach toward biomolecule imaging and appraising different physiological processes with molecular resolution is highlighted. The review raises awareness regarding current obstacles in biological sample preparation and possible ways to conquer these difficulties. Subsequently, the recent applications of STM and AFM on various biomolecules with representative examples like DNA, protein, and carbohydrates are discussed. The conductance measurement studies of the biological samples emphasize applications like drug delivery, biosensors, molecular electronics, and spintronics fields. This is followed by an outlook of future perspectives making a pavement toward the basic science and applied field of biomolecules using SPM technology.

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“…Such magnetic measurements performed on dried powders or colloidal suspensions are necessary for optimizing the chemical synthesis, as well as for concluding about the magnetic state. MFM on the other hand is a technique able to image individual clusters and to address their magnetization states at the nanometer scale. − This technique has been used for revealing magnetic properties of individual NPs − and of magnetically correlated grain systems . Nevertheless, MFM has also the potential to qualitatively investigate the magnetization state of clusters made of several NPs, in addition to their morphology, size characteristics, and separation. , Moreover, in some cases, the magnetic interaction forces measured by the microscope can also be used for quantitative magnetization studies under magnetic fields. , …”

Section: Introductionmentioning

confidence: 99%

Imaging Large Iron-Oxide Nanoparticle Clusters by Field-Dependent Magnetic Force Microscopy

et al. 2021

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Iron-oxide nanoparticles are intensively considered for high-performance biomedical applications, where simultaneous functionalities, such as magnetic state, large surface area for maximal protein/enzyme binding, high magnetization values to provide large signals, and good dispersion in liquid media, are usually required. In this context, the association of individual nanoparticles into large clusters is of particular interest. Here, we present a magnetic force microscopy (MFM) approach capable to image individual nanoparticulate clusters as large as 350 nm at room temperature and under variable magnetic fields. It is shown that an in situ removal of electrostatic interactions─particularly important for large particle sizes supported by dielectric substrates─in MFM experiments based on phase detection allows us to image the magnetic state of individual clusters. After taking into account the magnetization behavior of the microscope tip, the phase signal reveals a gradual and uniform rotation of the magnetization with the magnetic field and the absence of a hysteretic behavior for all investigated clusters.

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Magnetic Imaging of Encapsulated Superparamagnetic Nanoparticles by Data Fusion of Magnetic Force Microscopy and Atomic Force Microscopy Signals for Correction of Topographic Crosstalk

Cited by 10 publications

References 22 publications

Determination of the dielectric constant of non-planar nanostructures and single nanoparticles by electrostatic force microscopy

Determination of the dielectric constant of non-planar nanostructures and single nanoparticles by electrostatic force microscopy

Envision and Appraisal of Biomolecules and Their Interactions through Scanning Probe Microscopy

Imaging Large Iron-Oxide Nanoparticle Clusters by Field-Dependent Magnetic Force Microscopy

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