Published by the American Institute of Physics. Related Articles Nonlinear multimode dynamics and internal resonances of the scan process in noncontacting atomic force microscopy J. Appl. Phys. 112, 074314 (2012) The importance of cantilever dynamics in the interpretation of Kelvin probe force microscopy J. Appl. Phys. 112, 064510 (2012) Analysis of the lateral resolution of electrostatic force gradient microscopy J. Appl. Phys. 112, 064112 (2012) Reply to "Comment on 'The long range voice coil atomic force microscope'" [Rev. Sci. Instrum. 83, 097103 (2012)] Rev. Sci. Instrum. 83, 097104 (2012) Comment on "The long range voice coil atomic force microscope" [Rev. Sci. Instrum. 83, 023705 (2012)] Rev. Sci. Instrum. 83, 097103 (2012) Additional information on Rev. Sci. Instrum.This article describes the design of a versatile ultrahigh vaccum ͑UHV͒ low temperature scanning force microscope system. The system allows scanning probe microscopy measurements at temperatures between 6 and 400 K and in magnetic fields up to 7 T. Cantilevers and samples can be prepared in UHV and transferred to the microscope. We describe some technical details of our system and present first measurements performed at different temperatures and in various scanning force microscopy operation modes. We demonstrate distortion free and calibrated images at temperatures ranging from 8 to 300 K, atomic resolution on NaCl at 7.6 K and various magnetic force microscopy images of vortices in high transition temperature superconductors. It is demonstrated that our instrumentation reaches the thermodynamically determined sensitivity limit. Using standard cantilevers force gradients in the 10 Ϫ6 N/m range, corresponding forces of about 10 Ϫ15 N can be measured.