Magnetic effects on the resonant X-ray reflectivity: circular dichroism at the 2p edges of Ni

Sacchi, M.; Vogel, Jan; Iacobucci, S.

doi:10.1016/0304-8853(94)01668-2

Cited by 16 publications

(1 citation statement)

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“…[7][8][9][10][11][12] Work has mainly centered on artificially modulated structures such as multilayers 8,9,11 or striped domains. 12 The activity of our group in Orsay started in 1994, with a series of studies on in situ-prepared clean surfaces 13 and thin films 14 aimed at extending x-ray resonant magnetic scattering ͑XRMS͒ techniques to surface science. The lack of an adequate UHV goniometer limited our studies to photonenergy-dependent measurements at fixed scattering angles.…”

Section: Introductionmentioning

confidence: 99%

Ultrahigh-vacuum soft x-ray reflectometer

Sacchi

Spezzani

Torelli

et al. 2003

Review of Scientific Instruments

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We have designed, built, and tested a new instrument for soft x-ray scattering experiments. The reflectometer works under ultrahigh vacuum and permits in situ preparation and characterization of the samples. In particular, deposition and sputtering operations can be performed while measuring x-ray scattering. We report the results of test measurements performed using synchrotron radiation. The precision of the combined positioning of sample and detector angles is better than 0.01°. Separately, sample and detector rotations have a repeatability that is better than 0.005°. Applications will be in the field of surface physics, with emphasis on magnetic properties of surfaces, thin films, and multilayered structures.

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