Magnetic Dipole Resonance and Coupling Effects Directly Enhance the Raman Signals of As-Grown Graphene on Copper Foil by over One Hundredfold

Tseng, Yi-Chuan; Lin, Tzu‐Yao; Lee, Yang–Chun; Ku, Che‐Kuei; Chen, Chun-Wei; Chen, Hsuen‐Li

doi:10.1021/acs.chemmater.7b02291

Cited by 3 publications

(1 citation statement)

References 52 publications

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“…This has been exploited for detecting these resonances, but also for other applications such as thermometry, crystallinity characterization and nonlinear spectroscopy [23,24,25,26,27]. In addition, the external near-field enhancements produced by Mie resonances in silicon nanoparticles has also been used to enhance the Raman signal from nearby material for sensing purposes [28,29,30,31,32]. However, these previous results are all based on Raman spectroscopy at a single fixed Raman excitation wavelength.…”

Section: Introductionmentioning

confidence: 99%

Probing optical resonances of silicon nanostructures using tunable-excitation Raman spectroscopy

et al. 2019

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Optical materials with a high refractive index enable effective manipulation of light at the nanoscale through strong light confinement. However, the optical near field, which is mainly confined inside such high-index nanostructures, is difficult to probe with existing measurement techniques. Here, we exploit the connection between Raman scattering and the stored electric energy to detect resonance-induced near-field enhancements in silicon nanostructures. We introduce a Raman setup with a wavelength-tunable laser, which allows us to tune the Raman excitation wavelength and thereby identify Fabry-Pérot and Mie type resonances in silicon thin films and nanodisk arrays, respectively. We measure the optical near-field enhancement by comparing the Raman response on and off resonance. Our results show that tunableexcitation Raman spectroscopy can be used as a complimentary far-field technique to reflection measurements for nanoscale characterization and quality control. As proof-of-principle for the latter, we demonstrate that Raman spectroscopy captures fabrication imperfections in the silicon nanodisk arrays, enabling an all-optical quality control of metasurfaces.

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Section: Introductionmentioning

confidence: 99%

Probing optical resonances of silicon nanostructures using tunable-excitation Raman spectroscopy

et al. 2019

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Optical Inspection of 2D Materials: From Mechanical Exfoliation to Wafer‐Scale Growth and Beyond

et al. 2021

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Optical inspection is a rapid and non-destructive method for characterizing the properties of two-dimensional (2D) materials. With the aid of optical inspection, in situ and scalable monitoring of the properties of 2D materials can be implemented industrially to advance the development and progress of 2D material-based devices toward mass production. This review discusses the optical inspection techniques that are available to characterize various 2D materials, including graphene, transition metal dichalcogenides (TMDCs), hexagonal boron nitride (h-BN), group-III monochalcogenides, black phosphorus (BP), and group-IV monochalcogenides. First, the authors provide an introduction to these 2D materials and the processes commonly used for their fabrication. Then they review several of the important structural properties of 2D materials, and discuss how to characterize them using appropriate optical inspection tools. The authors also describe the challenges and opportunities faced when applying optical inspection to recently developed 2D materials, from mechanically exfoliated to wafer-scale-grown 2D materials. Most importantly, the authors summarize the techniques available for largely and precisely enhancing the optical signals from 2D materials. This comprehensive review of the current status and perspective of future trends for optical inspection of the structural properties of 2D materials will facilitate the development of next-generation 2D material-based devices.

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Raman scattering in high-refractive-index nanostructures

Raza

2020

Nanophotonics

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The advent of resonant dielectric nanomaterials has provided a new path for concentrating and manipulating light on the nanoscale. Such high-refractive-index materials support a diverse set of low-loss optical resonances, including Mie resonances, anapole states, and bound states in the continuum. Through these resonances, high-refractive-index materials can be used to engineer the optical near field, both inside and outside the nanostructures, which opens up new opportunities for Raman spectroscopy. In this review, we discuss the impact of high-refractive-index nano-optics on Raman spectroscopy. In particular, we consider the intrinsic Raman enhancement produced by different dielectric resonances and their theoretical description. Using the optical reciprocity theorem, we derive an expression which links the Raman enhancement to the enhancement of the stored electric energy. We also address recent results on surface-enhanced Raman spectroscopy based on high-refractive-index dielectric materials along with applications in stimulated Raman scattering and nanothermometry. Finally, we discuss the potential of Raman spectroscopy as a tool for detecting the optical near-fields produced by dielectric resonances, complementing reflection and transmission measurements.

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Magnetic Dipole Resonance and Coupling Effects Directly Enhance the Raman Signals of As-Grown Graphene on Copper Foil by over One Hundredfold

Cited by 3 publications

References 52 publications

Probing optical resonances of silicon nanostructures using tunable-excitation Raman spectroscopy

Probing optical resonances of silicon nanostructures using tunable-excitation Raman spectroscopy

Optical Inspection of 2D Materials: From Mechanical Exfoliation to Wafer‐Scale Growth and Beyond

Raman scattering in high-refractive-index nanostructures

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