“…This technique enables us to correlate the electrical properties of a material with its microstructure, and also helps to analyze and separate the contributions from various components (i.e., grains, grain boundary, interfaces, etc.) of polycrystalline materials in the wide frequency range [10][11][12][13][14][15]. From the measured data, the complex impedance function is computed as Z * = Z − jZ , where Z and Z are the real and imaginary parts of Z * respectively, and j = (−1) 1/2 .…”