1995
DOI: 10.1103/physrevb.52.13450
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Magnetic anisotropies of sputtered Fe films on MgO substrates

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Cited by 98 publications
(53 citation statements)
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“…In particular, the value 2K 1 /M ϭ0.30 kOe obtained for the uncovered Fe͑60 Å͒ layer is very close to the value 0.34 kOe measured for Fe͑50 Å͒/Si͑111͒. 10 The observed linewidth for the Fe͑60 Å͒ film was approximately 37 Oe, close to the best values observed for Fe and other transition metal films, 14,15 indicating the good crystallinity of the samples. Figure 2 shows the variation of the linewidth versus in-plane angle for Nd͑10 Å͒/Fe͑100 Å͒/ Si͑111͒.…”
Section: A Resonance Field and Linewidthsupporting
confidence: 64%
“…In particular, the value 2K 1 /M ϭ0.30 kOe obtained for the uncovered Fe͑60 Å͒ layer is very close to the value 0.34 kOe measured for Fe͑50 Å͒/Si͑111͒. 10 The observed linewidth for the Fe͑60 Å͒ film was approximately 37 Oe, close to the best values observed for Fe and other transition metal films, 14,15 indicating the good crystallinity of the samples. Figure 2 shows the variation of the linewidth versus in-plane angle for Nd͑10 Å͒/Fe͑100 Å͒/ Si͑111͒.…”
Section: A Resonance Field and Linewidthsupporting
confidence: 64%
“…In addition to this magnetocrystalline anisotropy, different structural and morphological factors can be sources of additional contributions to the effective anisotropy experimentally obtained in epitaxial Fe/ MgO͑001͒ films. For example, Goryunov et al 12 have reported an important surface anisotropy for film thicknesses around 1000 Å, which they attribute to strain relaxation extended as far as 45 Å from the film-substrate interface. Other reported sources of additional contributions to the magnetic anisotropy, usually of uniaxial character, are both deposition geometry, particularly for the oblique-incidence of Fe on MgO(001), [13][14][15] and the presence of steps in the substrate.…”
Section: Introductionmentioning
confidence: 99%
“…[19] due to Co 70 Fe 30 having an arbitrary crystalline orientation. First, the equilibrium angle of free-layer magnetization (φ) under H ext with φ H is given by Eq.…”
mentioning
confidence: 99%