1993
DOI: 10.1016/0304-8853(93)91233-w
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Magnetic and transport properties of Ni/Ti, NiC/Ti and Co/Cu multilayers at high fields

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Cited by 12 publications
(1 citation statement)
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“…The quality of the interface is strongly influenced by interdiffusion, intermixing and phase formation at the interface; it is therefore very interesting to investigate the role of various microstructural parameters at the interface. In this respect, while many structural and thermal stability studies on Ti/Ni MLs have been extensively reported in the literature [11][12][13][14][15], surprisingly few reports are available on corresponding magnetic [16][17][18][19][20][21] and electronic property [16,22] investigations. Recently, in our investigation carried out on annealed Ti/Ni MLs [16], we have reported a correlation study of structural, chemical and magnetic properties and it has been found that the Ti/Ni ML structures show amorphization in the temperature range of 300-400 • C. However, to the best of our knowledge no studies have been reported so far in the literature regarding the interface electronic property investigation of as-deposited as well as annealed Ti/Ni ML structures.…”
Section: Introductionmentioning
confidence: 99%
“…The quality of the interface is strongly influenced by interdiffusion, intermixing and phase formation at the interface; it is therefore very interesting to investigate the role of various microstructural parameters at the interface. In this respect, while many structural and thermal stability studies on Ti/Ni MLs have been extensively reported in the literature [11][12][13][14][15], surprisingly few reports are available on corresponding magnetic [16][17][18][19][20][21] and electronic property [16,22] investigations. Recently, in our investigation carried out on annealed Ti/Ni MLs [16], we have reported a correlation study of structural, chemical and magnetic properties and it has been found that the Ti/Ni ML structures show amorphization in the temperature range of 300-400 • C. However, to the best of our knowledge no studies have been reported so far in the literature regarding the interface electronic property investigation of as-deposited as well as annealed Ti/Ni ML structures.…”
Section: Introductionmentioning
confidence: 99%