Magnetic and structural properties of permalloy-tantalum multilayer thin films

Hill, E.W.; Li, J. P.; Birtwistle, John

doi:10.1063/1.348348

Cited by 6 publications

(1 citation statement)

References 3 publications

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“…In addition, the shape was changed from a 4 mm × 4 mm square to a 2 mm × 4 mm rectangle to make alignment of the sample in the magnetometer easier. The films were grown in a magnetic field of 15.9 kA/m (200 Oe) oriented along the long axis of the rectangle in order to induce a uniaxial anisotropy [ 3 ]. VSM hysteresis loops measured with the magnetic field applied parallel and perpendicular to the long axis of the sample, as well as a picture of the die, are shown in Fig.…”

Section: Development Of Thin-film Magnetic Reference Materialsmentioning

confidence: 99%

Development of a thin film magnetic moment reference material

Pappas¹,

Halloran²,

Owings³

et al. 2008

J. Res. Natl. Inst. Stand. Technol.

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In this paper we present the development of a magnetic moment reference material for low moment magnetic samples. We first conducted an inter-laboratory comparison to determine the most useful sample dimensions and magnetic properties for common instruments such as vibrating sample magnetometers (VSM), SQUIDs, and alternating gradient field magnetometers. The samples were fabricated and then measured using a vibrating sample magnetometer. Their magnetic moments were calibrated by tracing back to the NIST YIG sphere, SRM 2853.

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Section: Development Of Thin-film Magnetic Reference Materialsmentioning

confidence: 99%

Development of a thin film magnetic moment reference material

Pappas¹,

Halloran²,

Owings³

et al. 2008

J. Res. Natl. Inst. Stand. Technol.

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Determination of the saturation magnetization of ion irradiated Py/Ta samples using polar magneto-optical Kerr effect and ferromagnetic resonance

Markó

Strache

Lenz

et al. 2010

Applied Physics Letters

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Based on polar magneto-optical Kerr effect and frequency dependent ferromagnetic resonance measurements, a method has been found that allows for the quantitative determination of the saturation magnetization of samples with unknown effective magnetic volume. Conventional magnetometry cannot be used for this purpose. Thin Py/Ta multilayers with an overall Py thickness of 20 nm but different number of interfaces are used as test systems. By means of Ne ion irradiation the magnetic moment and the saturation magnetization are affected due to interfacial mixing. With both increasing ion fluence and increasing number of Py/Ta interfaces, a decrease of saturation magnetization is observed.

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The effect of deposition process on the magnetic properties of coupled permalloy thin films

Hill

Birtwistle

1993

Journal of Applied Physics

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Double layer thin films of permalloy (layer thickness 200-1300 A) with tantalum (50 A) as a nonmagnetic spacer have been prepared by e-beam evaporation. The effec.t of deposition parameters, especially the substrate temperature on the magnetic properties of these films has been examined. The coercivity(I&) of the double layer films was found to be very sensitive to the substrate temperature in the permalloy layer thickness range of 200-600 A. The coercivity of the films deposited at 40 "C is lower than at 300 "C and is almost independent of the Permalloy layer thickness. The XRD patterns and STM images of these two films exhibit large differences in permalloy grain size and grain orientation. However, the He of the single layer films deposited nnder the same conditions as the double layer films shows no significant change in this thickness region. The results indicate that the change of interface condition is primarily responsible for the Ifc variation in the coupled films deposited at different substrate temperatures and strongly suggest t.hat interface roughness plays a dominant role in the coupling between the permalloy layers.

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Magnetic and structural properties of permalloy-tantalum multilayer thin films

Cited by 6 publications

References 3 publications

Development of a thin film magnetic moment reference material

Development of a thin film magnetic moment reference material

Determination of the saturation magnetization of ion irradiated Py/Ta samples using polar magneto-optical Kerr effect and ferromagnetic resonance

The effect of deposition process on the magnetic properties of coupled permalloy thin films

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