Accurate birefringence measurements are necessary for designing and producing optics that manipulate polarized light. This is of particular importance for waveplates, which must be polished to a specific thickness, typically with a tolerance on the order of ± 0.25 µm. In this work the birefringence of three common waveplate materials is studied: crystal quartz (over the wavelength range of 320-1650 nm), magnesium fluoride (over the wavelength range of 300-1800 nm), and synthetic sapphire (over the wavelength range of 300-1400 nm). Two independent birefringence measurement methods are reported, which agree with each other to within 5 × 10 −6 for each material. These methods are compared to previously published values, which are within 1.5 × 10 −5 for a large portion of the wavelength range measured for quartz and magnesium fluoride, and within 4 × 10 −5 for sapphire. Additionally, dispersion formulae for each material are determined.