2015
DOI: 10.1016/j.cap.2015.04.036
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Macroscopic and microscopic electrical properties of Cu(In,Ga)Se2 thin-film solar cells with various Ga/(In+Ga) contents

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Cited by 10 publications
(5 citation statements)
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“…This illustration highlights the GBs as the main conduction channels, particularly, when an external bias is applied to the sample emitting electrons from the samples to the grounded tip. 24 The samples with alkali PDT showed enhanced formation of the surface current presumably due to the increased carrier concentrations. Additionally, Sharma et al recently demonstrated that the CIGS thin lm treated with Rb and Cs possessed higher carrier concentrations and enhanced homogeneity of carrier concentration.…”
Section: Resultsmentioning
confidence: 95%
“…This illustration highlights the GBs as the main conduction channels, particularly, when an external bias is applied to the sample emitting electrons from the samples to the grounded tip. 24 The samples with alkali PDT showed enhanced formation of the surface current presumably due to the increased carrier concentrations. Additionally, Sharma et al recently demonstrated that the CIGS thin lm treated with Rb and Cs possessed higher carrier concentrations and enhanced homogeneity of carrier concentration.…”
Section: Resultsmentioning
confidence: 95%
“…The overall Cu/(Ga + In) (CGI) ratio was 0.86 for all the samples, whereas the Ga/(Ga + In) (GGI) ratios were 0.34, 0.33, and 0.32 for samples A, B, and C, respectively. In our previous study, it was found that the optimal GGI ratio results in a significant improvement in the electrical properties, such as a high shunt resistance and low series resistance . Furthermore, the elemental distribution was measured using SIMS.…”
Section: Resultsmentioning
confidence: 99%
“…Conversely, the downward E c band bending structure at the GBs can enhance the electron collection at the GBs. CIGSe mainly shows a downward E c band bending structure at the GBs 20–22 ; in CZTSSe, downward 23–28 or upward 7,9,27–31 E c band bending structures at the GBs are observed. Kelvin probe force microscopy (KPFM) is a useful method to identify the surface potential of an absorber surface 32,33 .…”
Section: Introductionmentioning
confidence: 96%
“…These surface local current characteristics can be identified using conducting atomic force microscopy (c-AFM). 7,9,[20][21][22][23][25][26][27][28]34 The elemental variations between the IGs and GBs can cause band bending at the GBs. Using atom probe tomography (APT), the characteristics of the elemental variations between the IGs and GBs in the CIGSe [35][36][37][38][39][40][41] and CZTSSe [42][43][44] absorbers were reported.…”
Section: Introductionmentioning
confidence: 99%
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