An efficient carrier transport is essential for enhancing
the performance
of thin-film solar cells, in particular Cu(In,Ga)Se2 (CIGS)
solar cells, because of their great sensitivities to not only the
interface but also the film bulk. Conventional methods to investigate
the outcoming carriers and their transport properties measure the
current and voltage either under illumination or dark conditions.
However, the evaluation of current and voltage changes along the cross-section
of the devices presents several limitations. To mitigate this shortcoming,
we prepared gently etched devices and analyzed their properties using
micro-Raman scattering spectroscopy, Kelvin probe force microscopy,
and photoluminescence measurements. The atomic distributions and microstructures
of the devices were investigated, and the defect densities in the
device bulk were determined via admittance spectroscopy. The effects
of Ga grading on the charge transport at the CIGS–CdS interface
were categorized into various types of band offsets, which were directly
confirmed by our experiments. The results indicated that reducing
open-circuit voltage loss is crucial for obtaining a higher power
conversion efficiency. Although the large Ga grading in the CIGS absorber
induced higher defect levels, it effectuated a smaller open-circuit
voltage loss because of carrier transport enhancement at the absorber–buffer
interface, resulting from the optimized conduction band offsets.