2022
DOI: 10.1016/j.microrel.2022.114553
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Machine learning for board-level drop response of BGA packaging structure

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Cited by 13 publications
(3 citation statements)
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“…In this work, we aim to propose a machine learning (ML) model, which enables to predict the microstructural items, which are the indicators of IMC-growth mechanism under thermal cycling. In the microelectronics industry, the ML-based model has been extensively used to predict the reliability of components on the basis of physical and mechanical parameters without considering the microstructural characteristics [22][23][24][25][26]. Hence, our ML model can open a new solution for evaluating the solder microstructure in a wide range of thermal cycles by just examining few samples.…”
Section: Introductionmentioning
confidence: 99%
“…In this work, we aim to propose a machine learning (ML) model, which enables to predict the microstructural items, which are the indicators of IMC-growth mechanism under thermal cycling. In the microelectronics industry, the ML-based model has been extensively used to predict the reliability of components on the basis of physical and mechanical parameters without considering the microstructural characteristics [22][23][24][25][26]. Hence, our ML model can open a new solution for evaluating the solder microstructure in a wide range of thermal cycles by just examining few samples.…”
Section: Introductionmentioning
confidence: 99%
“…A machine learning (ML) framework has recently been utilized to analyze various engineering problems, including cardiovascular organs [14][15][16] , cantilevered structures 17,18 , and composite materials 19,20 . In particular, the ML framework allows the prediction of critical reliability parameters in chip package structures, such as energy release rates 21 , warpage behaviors 22 , and drop responses 23 . Furthermore, several studies have presented analysis models for the accelerated reliability of solder joints under thermal cycling conditions using arti cial neural network (ANN) architectures [24][25][26] .…”
Section: Introductionmentioning
confidence: 99%
“…[19,20] In particular, the ML framework allows the prediction of critical reliability parameters in chip package structures, such as energy release rates, [21] warpage behaviors, [22] and drop responses. [23] Furthermore, several studies have presented analysis models for the accelerated reliability of solder joints under thermal cycling conditions using artificial neural network (ANN) architectures. [24][25][26] These ML approaches driven by FEM simulation data have been regarded as a fast and accurate surrogate of the simulation.…”
Section: Introductionmentioning
confidence: 99%