2024
DOI: 10.1063/5.0179881
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Machine learning-enhanced detection of minor radiation-induced defects in semiconductor materials using Raman spectroscopy

Jia Yi Chia,
Nuatawan Thamrongsiripak,
Sornwit Thongphanit
et al.

Abstract: Radiation damage in semiconductor materials is a crucial concern for electronic applications, especially in the fields of space, military, nuclear, and medical electronics. With the advancements in semiconductor fabrication techniques and the trend of miniaturization, the quality of semiconductor materials and their susceptibility to radiation-induced defects have become more important than ever. In this context, machine learning (ML) algorithms have emerged as a promising tool to study minor radiation-induced… Show more

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“…It also highlights how "Raman" as a technique needs to equip itself in the evolving era of artificial intelligence and machine learning (AI/ ML). 31…”
Section: Introductionmentioning
confidence: 99%
See 1 more Smart Citation
“…It also highlights how "Raman" as a technique needs to equip itself in the evolving era of artificial intelligence and machine learning (AI/ ML). 31…”
Section: Introductionmentioning
confidence: 99%
“…This article highlights some of the key advantages of the Raman effect/spectroscopy, explaining why this characterization method is extremely valuable in understanding detailed molecular structures across different sample phases and geometries in different fields of science. It also highlights how “Raman” as a technique needs to equip itself in the evolving era of artificial intelligence and machine learning (AI/ML) …”
Section: Introductionmentioning
confidence: 99%