2020
DOI: 10.1088/2632-2153/ab7d2f
|View full text |Cite
|
Sign up to set email alerts
|

Machine learning at the (sub)atomic scale: next generation scanning probe microscopy

Abstract: We discuss the exciting prospects for a step change in our ability to map and modify matter at the atomic/molecular level by embedding machine learning algorithms in scanning probe microscopy (with a particular focus on scanning tunnelling microscopy, STM). This nano-AI hybrid approach has the far-reaching potential to realise a technology capable of the automated analysis, actuation, and assembly of matter with a precision down to the single chemical bond limit.

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1

Citation Types

0
30
0

Year Published

2020
2020
2024
2024

Publication Types

Select...
8
1

Relationship

0
9

Authors

Journals

citations
Cited by 33 publications
(31 citation statements)
references
References 78 publications
0
30
0
Order By: Relevance
“…Our methodological approach builds upon the general philosophy of using machine learning to handle data analysis challenges in Scanning Probe Microscopy (SPM) [46][47][48][49] and the specic use of deep learning Convolutional Neural Networks (CNN) 50 to recognize features in high-resolution SPM images. Recent examples include conditioning of SPM tips, 51 identication of defects with STM 52,53 and nanostructures with AFM, 54 and making molecular structure predictions from AFM images.…”
mentioning
confidence: 99%
“…Our methodological approach builds upon the general philosophy of using machine learning to handle data analysis challenges in Scanning Probe Microscopy (SPM) [46][47][48][49] and the specic use of deep learning Convolutional Neural Networks (CNN) 50 to recognize features in high-resolution SPM images. Recent examples include conditioning of SPM tips, 51 identication of defects with STM 52,53 and nanostructures with AFM, 54 and making molecular structure predictions from AFM images.…”
mentioning
confidence: 99%
“…Breaking of cantilever tip after long period of functionalization and damaging live cell samples due to lack of optimization of the loading forces are major problems that make this method low throughput (Xie and Ren 2019a;Xie and Ren 2019b). Over the past couple of years, researchers in the material science community have begun to combine artificial intelligence (AI) and machine learning approaches (Huang et al, 2018;Müller et al, 2019;Alldritt et al, 2020;Gordon and Moriarty 2020;Krull et al, 2020) with AFM for various pattern recognition and data post-processing tasks. Also, some initial research happened to select appropriate AFM scanning areas and data modeling using deep learning.…”
Section: Discussionmentioning
confidence: 99%
“…The method can also be applied to images of systems where direct simulation is impossible due to size, complexity or lack of information. Combined with developments in the autonomous functionalization of the tip in SPM [36], this promises a future of potential in electrostatics for ED-AFM.…”
Section: Discussionmentioning
confidence: 99%
“…In general, the adoption of ML methods into materials analysis has seen rapid recent growth [28][29][30] and this has been followed by an equivalent growth in its applications to image analysis in SPM [31][32][33][34][35][36]. Here we build upon our ML method for predicting molecular structure from AFM images [37], to predict the electrostatic field of the sample molecule.…”
Section: Methodsmentioning
confidence: 99%