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Room temperature semiconductor radiation detectors (RTSD) for X-ray and $$\gamma$$ γ -ray detection are vital tools for medical imaging, astrophysics and other applications. CdZnTe (CZT) has been the main RTSD for more than three decades with desired detection properties. In a typical pixelated configuration, CZT have electrodes on opposite ends. For advanced event reconstruction algorithms at sub-pixel level, detailed characterization of the RTSD is required in three dimensional (3D) space. However, 3D characterization of the material defects and charge transport properties in the sub-pixel regime is a labor intensive process with skilled manpower and novel experimental setups. Presently, state-of-art characterization is done over the bulk of the RTSD considering homogenous properties. In this paper, we propose a novel physics based machine learning (PBML) model to characterize the RTSD over a discretized sub-pixelated 3D volume which is assumed. Our novel approach is the first to characterize a full 3D charge transport model of the RTSD. In this work, we first discretize the RTSD between a pixelated electrodes spatially into 3 dimensions—x, y, and z. The resulting discretizations are termed as voxels in 3D space. In each voxel, the different physics based charge transport properties such as drift, trapping, detrapping and recombination of charges are modeled as trainable model weights. The drift of the charges considers second order non-linear motion which is observed in practice with the RTSDs. Based on the electron–hole pair injections as input to the PBML model, and signals at the electrodes, free and trapped charges (electrons and holes) as outputs of the model, the PBML model determines the trainable weights by backpropagating the loss function. The trained weights of the model represents one-to-one relation to that of the actual physical charge transport properties in a voxelized detector.
Room temperature semiconductor radiation detectors (RTSD) for X-ray and $$\gamma$$ γ -ray detection are vital tools for medical imaging, astrophysics and other applications. CdZnTe (CZT) has been the main RTSD for more than three decades with desired detection properties. In a typical pixelated configuration, CZT have electrodes on opposite ends. For advanced event reconstruction algorithms at sub-pixel level, detailed characterization of the RTSD is required in three dimensional (3D) space. However, 3D characterization of the material defects and charge transport properties in the sub-pixel regime is a labor intensive process with skilled manpower and novel experimental setups. Presently, state-of-art characterization is done over the bulk of the RTSD considering homogenous properties. In this paper, we propose a novel physics based machine learning (PBML) model to characterize the RTSD over a discretized sub-pixelated 3D volume which is assumed. Our novel approach is the first to characterize a full 3D charge transport model of the RTSD. In this work, we first discretize the RTSD between a pixelated electrodes spatially into 3 dimensions—x, y, and z. The resulting discretizations are termed as voxels in 3D space. In each voxel, the different physics based charge transport properties such as drift, trapping, detrapping and recombination of charges are modeled as trainable model weights. The drift of the charges considers second order non-linear motion which is observed in practice with the RTSDs. Based on the electron–hole pair injections as input to the PBML model, and signals at the electrodes, free and trapped charges (electrons and holes) as outputs of the model, the PBML model determines the trainable weights by backpropagating the loss function. The trained weights of the model represents one-to-one relation to that of the actual physical charge transport properties in a voxelized detector.
Room-temperature semiconductor radiation detectors (RTSD) such as CdZnTe are popular in Computed Tomography (CT) imaging and other applications. Transport properties and material defects with respect to electron and hole transport often need to be characterized, which is a labor intensive process. However, these defects often vary from one RTSD to another and are not known a priori during characterization of the material. In recent years, physics-inspired machine learning (PI-ML) models have been developed for the RTSDs which have the ability to characterize the defects in a RTSD by discretizing it volumetrically. These learning models capture the heterogeneity of the defects in the RTSD—which arises due to the fabrication process and the energy bands of elements in the RTSD. In those models, the different defects of RTSD—trapping, detrapping and recombination for electrons and holes—are present. However, these defects are often unknown. In this work, we show the capabilities of a PI-ML model which has been developed considering all the material defects to identify certain defects which are present (or absent). Additionally, these models can identify the defects over the volume of the RTSD in a discretized manner.
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