2023
DOI: 10.1088/2632-2153/acbb52
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Machine-learning approach for quantified resolvability enhancement of low-dose STEM data

Abstract: High-resolution electron microscopy is achievable only when a high electron dose is employed, a practice that may cause damage to the specimen and, in general, affects the observation. This drawback sets some limitations on the range of applications of high-resolution electron microscopy. Our work proposes a strategy, based on machine learning, which enables a significant improvement in the quality of Scanning Transmission Electron Microscope images generated at low electron dose, strongly affected by Poisson … Show more

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Cited by 8 publications
(6 citation statements)
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“…Current research efforts in the field are focused on the construction of fully automated SPM processes. [316][317][318] Existing AI frameworks possess an algorithmic search of good sample regions and monitor the state of the probe. [319]…”
Section: Scanning Probe Microscopymentioning
confidence: 99%
“…Current research efforts in the field are focused on the construction of fully automated SPM processes. [316][317][318] Existing AI frameworks possess an algorithmic search of good sample regions and monitor the state of the probe. [319]…”
Section: Scanning Probe Microscopymentioning
confidence: 99%
“…ML provides robust tools for denoising data sets by effectively distinguishing between noise and essential features. Models such as convolutional neural networks (CNNs) and autoencoders are trained using diverse noisy simulated data , or experimental data. , The trained models adapt and generalize patterns discerned within noisy images, resulting in a significant reduction in image noise while preserving critical details during data postprocessing. This denoising capability is not confined to images alone; it is also applicable to spectroscopy data, , where the background noise can be efficiently suppressed.…”
Section: Application Of Machine Learning and Artificial Intelligence ...mentioning
confidence: 99%
“…This includes SEM [69] and x-ray tomographic [72] microscopy. DL can be used to remove noise from TEM images, which can improve image quality and facilitate downstream analysis [73][74][75][76][77][78][79][80][81]. DL-based denoising has been applied to SEM [82][83][84] and tomography [85,86] as well.…”
Section: Introductionmentioning
confidence: 99%