2024
DOI: 10.3390/electronics13163112
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Machine Fault Diagnosis: Experiments with Different Attention Mechanisms Using a Lightweight SqueezeNet Architecture

Mahe Zabin,
Ho-Jin Choi,
Muhammad Kubayeeb Kabir
et al.

Abstract: As artificial intelligence technology progresses, deep learning models are increasingly utilized for machine fault classification. However, a significant drawback of current state-of-the-art models is their high computational complexity, rendering them unsuitable for deployment in portable devices. This paper presents a compact fault diagnosis model that integrates a self-attention SqueezeNet architecture with a hybrid texture representation technique utilizing empirical mode decomposition (EMD) and a gammaton… Show more

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