LXIII. The precision of measurement of broad spectrum lines, with special reference to electron-diffraction photographs

Rymer, T B; Sc, Colachis

doi:10.1080/14786444508520936

Cited by 14 publications

(3 citation statements)

References 5 publications

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“…A number of sources of error by which the accuracy of the lattice parameter determination is influenced in this method are given in the literature (Meyerhoff, 1957, Rymer & Butler, 1945.…”

Section: A L C U L a T I O N O F T H E L A T T I C E Parameter A N mentioning

confidence: 99%

“…The absolute accuracy in the measurement of D on the plate for this combination is 20 pm. By a correct adjustment of the slit size of the densitometer the influence of the curvature of the measured rings may be so small as to be neglected (Rymer & Butler, 1945).…”

Section: A L C U L a T I O N O F T H E L A T T I C E Parameter A N mentioning

confidence: 99%

“…Both the camera constant 2XL0 and the correction factor c are calculated from the data obtained from the TlCl standard by application of the method of least squares (Squires, 1968). This experimental correction factor appears to be ten to twenty times greater than the corresponding geometrical correction 3 4 16L0 (see Fig.…”

Section: A L C U L a T I O N O F T H E L A T T I C E Parameter A N mentioning

confidence: 99%

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A method for accurately determining lattice parameters using electron diffraction in a commercial electron microscope

Lodder

Berg

1974

Journal of Microscopy

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Summary In this paper an electron diffraction method is discussed by which the lattice constants of polycrystalline thin films can be accurately determined (0.1%). The method involves the sequential examination of a standard material and the unknown material mounted on separate grids. The error which can arise through the possible difference in height of the two grids can be corrected by means of height and tilting adjustments. The analytical approach of the dependence of the camera constant on the ring diameter as given in literature appears to be insufficient. An experimental correction factor for this dependence is introduced. The accuracy of this method, and the influence of relevant sources of error, are discussed and explained in terms of some experimental results.

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“…A number of sources of error by which the accuracy of the lattice parameter determination is influenced in this method are given in the literature (Meyerhoff, 1957, Rymer & Butler, 1945.…”

Section: A L C U L a T I O N O F T H E L A T T I C E Parameter A N mentioning

confidence: 99%

Section: A L C U L a T I O N O F T H E L A T T I C E Parameter A N mentioning

confidence: 99%

Section: A L C U L a T I O N O F T H E L A T T I C E Parameter A N mentioning

confidence: 99%

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A method for accurately determining lattice parameters using electron diffraction in a commercial electron microscope

Lodder

Berg

1974

Journal of Microscopy

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The lattice constants of small crystals

Rymer

1957

Nuovo Cim

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XCVIII. The technique of precise electron-diffraction measurements with polycrystalline specimens

Rymer

1945

The London, Edinburgh, and Dublin Philosophical Magazine and Jo

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LXIII. The precision of measurement of broad spectrum lines, with special reference to electron-diffraction photographs

Cited by 14 publications

References 5 publications

A method for accurately determining lattice parameters using electron diffraction in a commercial electron microscope

A method for accurately determining lattice parameters using electron diffraction in a commercial electron microscope

The lattice constants of small crystals

XCVIII. The technique of precise electron-diffraction measurements with polycrystalline specimens

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