LXII.<i>An experimental investigation on the influence of the polished surface on the optical constants of copper as determined by the method of drude</i>

Lowery, H.; Wilkinson, H.T.; Smare, D.L.

doi:10.1080/14786443608561728

Cited by 24 publications

(2 citation statements)

References 6 publications

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“…The procedure adopted as a standard preparation for light microscopic metallography of the specimen is the method originated by JACQUET and used on copper by LOWERY, WILKINSON and SMARE. 6 ) The electrolyte used in this method was orthophosphoric acid with a specific gravity of 13.5 and the polishing time varied from 5 to 10 minutes and the etching took about 2 minutes at 1.2 volt and 6~8 Ajdm 2…”

Section: 'mentioning

confidence: 99%

Effect of Magnetic Field on Precipitation of Ferromagnetic Phase

Miyahara

Mitui

1952

J. Phys. Soc. Jpn.

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Section: 'mentioning

confidence: 99%

Effect of Magnetic Field on Precipitation of Ferromagnetic Phase

Miyahara

Mitui

1952

J. Phys. Soc. Jpn.

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“…Electron diffraction 9 indicates that a polished surface consists of, first, an amorphous or microcrystalline layer 30 or 40A thick (the Beilby layer); next, a relatively thicker layer of larger crystal fragments; finally the parent crystals. A recent optical investigation of copper, polished mechanically and then electrolytically, 10 indicates that polishing cold work extends to a depth of 13 microns or more. Since silicon-iron is harder than copper, it is likely that the depth of the damage in the former is more nearly comparable with the size of the magnetic blocks.…”

Section: Nature Of the Block Structurementioning

confidence: 99%

Properties of the Surface Magnetization in Ferromagnetic Crystals

Elmore

1937

Phys. Rev.

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are listed in Table VII. Eq. (40) was applied to these data with the assumption that N 0 for skeleton films on chromium was the same as for normal films. The value of nw which was required to satisfy Eq. (40) when iV/iVV = 0.7510 and i = 80° was nw = 1.295. Thus the method of building films simultaneously on glass and chromium affords a useful means of making two independent determinations of nw which cover a range of i from 14° to 80°.After the data given in Tables VI and VII were obtained, films were built on seven microscope slides, each film having steps of 333, 343, 353 layers. All were soaked in benzene for 1 min. Measurement of the angles i at which these films reflected the minimum m = 7 gave the result nw-1.32. It frequently happens that after a water solution has stood in a trough for several hours the values of nw which are then obtained are slightly higher than the initial values. This is probably due to a gradual accumulation in the solution of substances dissolved from the trough or taken up from the air.A SMALL magnetic field applied normal to the polished surface of a silicon-iron single crystal will cause magnetic powder in a colloid suspension placed on it to collect into regular patterns related to the crystal symmetry. To explain these patterns, which resemble mazes with paths about 4 microns wide on a (100) surface but consist of lines parallel to a [110] The slides were stacked in a pile and the birefringence of the total of the seven films was measured by means of a quartz wedge compensator using transmitted light. The relative phase retardation of the R s and R v rays corresponded to X/4 for sodium light at i = 48° and X/3 at i = 54°. The total thickness Nt w of the 2471 layers was 59,800A, taking % = 24.2A. Therefore the factor 5752£ in Eq. (28) was replaced by 59,800. For A/=1473A at i = 48° it was found that when ^i = 1.32 the value of n 3 which gave terms which satisfied Eq. (28) was Ws = 1.390. For A/=1964A at i = 54° the calculated value was n 3 = 1.391.A measurement of Brewster's angle made after these films were built gave the result ^ = 51° 17'. Substituting i B = 51° 17' and n = 1.32 in Eq. (34) we obtain n$= 1.383. The refractive indices of the normal films built at pH = 7.0 were Wi= 1.491, » 3 = 1.551 from Eqs. (12) and (25). The skeleton films having »i=1.32 and n 3 = 1.390 or 1.383 have therefore approximately the same value of n^ -ni as the normal films.axis on a (llO) surface, McKeehan and Elmore 1 assumed the surface to contain blocks about 2 microns on a side spontaneously magnetized along <100> or <110> axes in the surface, with opposing magnetizations at about one-half 1 LThe magnetic powder patterns found on polished iron crystals (which may contain a few percent of silicon) have been studied more carefully by using a macroscopic model and by investigating the forces on the powder particles. Reasons are given for preferring one of two simple models to explain the patterns; some interesting implications of the proposed model are then considered. Experiments are descr...

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Über die Struktur elektrisch polierter Kupferoberflächen

Moore

1938

Annalen der Physik

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Moore. u b e r die Xtruktur eleklrisch polierter Kupjeroberflachen 133 Cber d i e S t r u k t u r elelctrisch p o l i e r t e r Eupferobei$achem(Mit 4 Ahbildungen) Vorbemerkunge n Es ware sehr wunschenswert, wenn man eine glatt polierte Metalloberflache herstellen konnte, die durch den HerstellungsprozeB keine Veranderung, z. B. Kristallitverformung, erleidet. Vor 2 Jahren haben L o w e r y , W i l k i n s o n und S m a r e l ) die optischen Eigenschaften von Kup feroberflachen verglichen, die nach verschiedenen Methoden hergestellt wurden. Es wurden untersucht: 1. mechanisch

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LXII.An experimental investigation on the influence of the polished surface on the optical constants of copper as determined by the method of drude

Cited by 24 publications

References 6 publications

Effect of Magnetic Field on Precipitation of Ferromagnetic Phase

Effect of Magnetic Field on Precipitation of Ferromagnetic Phase

Properties of the Surface Magnetization in Ferromagnetic Crystals

Über die Struktur elektrisch polierter Kupferoberflächen

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