Lumped-circuit Modeling of Surface Charge Decay in a Needle-plane geometry

Abstract

<p>Partial discharge (PD) tests were carried out in a needle-plane geometry where the plane was covered by a dielectric barrier. PDs were generated by the application of a periodic negative step voltage. A typical lumped circuit model of the dielectric was created to simulate the bulk and surface conduction of space charge decay processes during corona discharges. The comparison was made between the simulation and the experimental results at the first cycle of the applied voltage. The result shows that at a lower applied voltage, the surface charges decay slower because of a lower surface and bulk conduction, however, they decay faster with the increasing applied voltage due to the increasing conduction.</p>