2014
DOI: 10.1016/j.jlumin.2014.05.030
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Luminescent and scintillation properties of Bi3+ doped Y2SiO5 and Lu2SiO5 single crystalline films

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Cited by 18 publications
(7 citation statements)
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“…In [14,15,19,24,58,78,95,102,109,113,119,202], the lower-energy emission band of Y3Ga5O12:Bi and Gd3Ga5O12:Bi [14], Y2Sn2O7:Bi [119], LaBO3:Bi [78,95], Y3Al5O12:Bi and LuAl5O12:Bi [15,19], YPO4:Bi The obtained data indicate that both the strong 3.45 eV emission and weak 3.30 eV emission arise from the triplet RES of Bi 3+ -related centers. It is not excluded that the 3.30 eV emission of Lu 2 SiO 5 :Bi arises from dimer {Bi 3+ -Bi 3+ } centers.…”
Section: Visible Luminescencementioning
confidence: 77%
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“…In [14,15,19,24,58,78,95,102,109,113,119,202], the lower-energy emission band of Y3Ga5O12:Bi and Gd3Ga5O12:Bi [14], Y2Sn2O7:Bi [119], LaBO3:Bi [78,95], Y3Al5O12:Bi and LuAl5O12:Bi [15,19], YPO4:Bi The obtained data indicate that both the strong 3.45 eV emission and weak 3.30 eV emission arise from the triplet RES of Bi 3+ -related centers. It is not excluded that the 3.30 eV emission of Lu 2 SiO 5 :Bi arises from dimer {Bi 3+ -Bi 3+ } centers.…”
Section: Visible Luminescencementioning
confidence: 77%
“…In many papers (see, e.g., [1,10,14,15,19,24,58,64,78,95,97,99,102,104,109,110,112,113,[119][120][121]128,154,158,159,201,202]), the lower-energy emission bands of Bi 3+ -doped compounds were ascribed to the {Bi 3+ -Bi 3+ } pairs or the clusters of Bi 3+ ions. The characteristics of this luminescence are presented in Table 4.…”
Section: On the Luminescence Ascribed In Literature To {Bi 3+ -Bi 3+ mentioning
confidence: 99%
“…They were exposed to the 241 Am source (fluence rate of 1.7 × 10 5 cm −2 ·s −1 , energy at samples surface of 5.06 MeV) built-into the Risø DA-20 TL/OSL reader. The ranges of used alpha particles in LSO and YSO hosts, calculated with SRIM software [14] were 11.7 µm and 13.4 µm, respectively. The thicknesses of SCFs in the investigated samples (see Table 1, column 6) were higher than the estimated ranges of alpha particles in these materials for all samples except for sample 3 (SCF's thickness 6.1 µm).…”
Section: Scf Preparation and Investigation Methodsmentioning
confidence: 99%
“…The continuous absorption of YSO-and LSO-based SCF samples throughout the whole spectrum up to 800 nm can be caused by the Pb 2+ →Pb 4+ charge transfer transitions [17]. with SRIM software [14] were 11.7 μm and 13.4 μm, respectively. The thicknesses of SCFs in the investigated samples (see Table 1, column 6) were higher than the estimated ranges of alpha particles in these materials for all samples except for sample 3 (SCF's thickness 6.1 μm).…”
Section: Absorption Spectramentioning
confidence: 99%
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