&lt;title&gt;Time stress measurement device: system design and synthesis&lt;/title&gt;

Harchani, Noursaied; Jiménez, Fernando R.; Al-Mohammed, Mohammed; Estève, D.; Courvoisier, M.

doi:10.1117/12.381647

Cited by 4 publications

(1 citation statement)

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“…Over the years the TSMD designs have been upgraded using advanced sensors [53], and miniaturized TSMD's are being developed due to advances in microprocessor and nonvolatile memory technologies [54].…”

Section: Monitoring Environmental and Usage Loadsmentioning

confidence: 99%

Prognostics and health management of electronics

Vichare

Pecht

2006

IEEE Trans. Comp. Packag. Technol.

379

165

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There has been a growing interest in monitoring the ongoing "health" of products and systems in order to predict failures and provide warning to avoid catastrophic failure. Here, health is defined as the extent of degradation or deviation from an expected normal condition. While the application of health monitoring, also referred to as prognostics, is well established for assessment of mechanical systems, this is not the case for electronic systems. However, electronic systems are integral to the functionality of most systems today, and their reliability is often critical for system reliability.This paper presents the state-of-practice and the current state-of-research in the area of electronics prognostics and health management. Four current approaches include built-in-test (BIT), use of fuses and canary devices, monitoring and reasoning of failure precursors, and modeling accumulated damage based on measured life-cycle loads. Examples are provided for these different approaches, and the implementation challenges are discussed. Index Terms-Built-in-test (BIT), prognostics and health management (PHM).

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Section: Monitoring Environmental and Usage Loadsmentioning

confidence: 99%

Prognostics and health management of electronics

Vichare

Pecht

2006

IEEE Trans. Comp. Packag. Technol.

379

165

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Prognostics and Health Management of Electronics

2008

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Prognostics and Health Monitoring of Electronics

Pecht

2006

2006 International Conference on Electronic Materials and Packaging

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<title>Time stress measurement device: system design and synthesis</title>

Cited by 4 publications

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Prognostics and health management of electronics

Prognostics and health management of electronics

Prognostics and Health Management of Electronics

Prognostics and Health Monitoring of Electronics

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