2000
DOI: 10.1117/12.403757
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<title>Surface defect detection with histogram-based texture features</title>

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Cited by 35 publications
(17 citation statements)
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“…This Wavelet due to begin optimal in both frequency and local domain, can utilize the benefits of signal processing in both domains [11]- [12].…”
Section: Texture Analysis and Feature Extraction Withmentioning
confidence: 99%
“…This Wavelet due to begin optimal in both frequency and local domain, can utilize the benefits of signal processing in both domains [11]- [12].…”
Section: Texture Analysis and Feature Extraction Withmentioning
confidence: 99%
“…most work focuses very specifically on the relevant problem domain. Among the statistical approaches, gray level statistics (Iivarinen, 2000;Chetverikov, 2000;Chetverikov and Hanbury, 2002), co-occurrence matrices (Rautkorpi and Iivarinen, 2005) and local binary patterns (Niskanen et al, 2001;Mäenpää et al, 2003;Tajeripour et al, 2008) are the most frequently used ones. Unser and Ade (1984) and Monadjemi et al (2004) make use of an Eigenfilter approach.…”
Section: Automatic Visual Inspectionmentioning
confidence: 99%
“…As an alternative approach, higher order statistical moments can be derived from a twodimensional histogram [18], where the relationship between gray level values and their spatial distribution allows a description of structural features. Such a technique is known as the gray level co-occurrence matrix (GLCM) [16].…”
Section: Two-dimensional Histogram (Glcm) Analysismentioning
confidence: 99%