1997
DOI: 10.1117/12.280532
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<title>Preliminary results on x-ray lithography using a compact plasma focus</title>

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Cited by 10 publications
(6 citation statements)
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“…Fig. 8 shows SXR lithographic exposures to confirm the SXR flux of NX1 and NX2 [13]. The resist used has a sensitivity rated at 100 mJ/cm and is placed 40 cm from the focus.…”
Section: Resultsmentioning
confidence: 99%
See 1 more Smart Citation
“…Fig. 8 shows SXR lithographic exposures to confirm the SXR flux of NX1 and NX2 [13]. The resist used has a sensitivity rated at 100 mJ/cm and is placed 40 cm from the focus.…”
Section: Resultsmentioning
confidence: 99%
“…The exposure was used to estimate the electron beam current as 50 A over the 5 Hz burst. The electron energy was estimated as 30 keV [13].…”
Section: Resultsmentioning
confidence: 99%
“…The emitted neutrons could be applied to perform radiographs and substance analysis, taking advantage of the penetration and activation properties of neutral radiation. The intense x-ray pulses produced by bremsstrahlung radiation from localized electron beams and from hot-spots are excellent candidates for radiography of moving or wet objects and for microelectronic lithography [21][22][23].…”
Section: Introduction and General Overviewmentioning
confidence: 99%
“…Two geometries were proposed for these devices, differing in the aspect ratio of the electrodes (i.e. the electrode length divided by the inner electrode diameter): the Filippov configuration [1] with an aspect ratio <1 (typical values are 0.2) and the Mather configuration [2], with aspect ratio >1 (typically, [5][6][7][8][9][10].…”
Section: Introductionmentioning
confidence: 99%
“…The emitted neutrons can be applied to perform radiographs and substance analysis, taking advantage of the penetration and activation properties of neutral radiation. The intense x-ray pulses produced by bremsstrahlung radiation from localized electron beams and from hot spots are excellent candidates for radiography of moving or wet objects and for microelectronic lithography [8][9][10]. On the other hand, ion and electron beams from the plasma focus are used in surface treatment.…”
Section: Introductionmentioning
confidence: 99%