&lt;title&gt;Nonuniformity of CCDs and the effects of spatial undersampling&lt;/title&gt;

Jorden, Paul; Deltorn, J.-M.; Oates, A. P.

doi:10.1117/12.176783

Cited by 26 publications

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“…The PSM images in Figures 14 and 15 show sensitivity peaks on channel stops as previously reported by Jorden et al (1994). Jorden et al attributed this to the charge diffusion due to the deep penetration depth of I band photons.…”

Section: Discussionsupporting

confidence: 62%

“…IPSV also leads to errors in astrometry and, in the case of spectra, errors in intensity and centre wavelength assignments of spectral features. Jorden, Deltorn, & Oates (1994) measured CCDs at multiple wavelengths and plotted the spatial variation pattern and its wavelength dependence. Their results showed that the variation pattern was more complex than would have been naively thought, with significant structure in both the column and row directions.…”

Section: Introductionmentioning

confidence: 99%

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Intra-Pixel Sensitivity Variation and Charge Transfer Inefficiency — Results of CCD Scans

Toyozumi

Ashley

2005

Publ. – Astron. Soc. Aust

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Abstract:The efficiency with which a charge-coupled device (CCD) detects photons depends, amongst other factors, on where within a pixel the photon hits. To explore this effect we have made detailed scans across a pixel for a front-illuminated three-phase EEV05-20 CCD using the standard astronomical B, V, R, and I colour filters. Pixel response functions and photometric sensitivity maps are derived from the scan images. Nonlinear charge transfer inefficiency (CTI) effects were observed and corrected for. The resulting images clearly show the intra-pixel sensitivity variations (IPSVs) due to the CCD electrode structure, and its dependence on wavelength. We briefly comment on the implications of IPSVs and CTI for high-precision photometry and astrometry.

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Section: Discussionsupporting

confidence: 62%

Section: Introductionmentioning

confidence: 99%

Intra-Pixel Sensitivity Variation and Charge Transfer Inefficiency — Results of CCD Scans

Toyozumi

Ashley

2005

Publ. – Astron. Soc. Aust

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“…4 For S (x y), we take the results reported by Ref. 5, which are only reported at two wavelengths, 600 and 850 nm. Below 600 nm, the variation of S is quite small, while at 850 nm, the peak-peak variation is 10%.…”

Section: Response Of Pixels To Image Motionmentioning

confidence: 99%

An efficient end-to-end model for the Kepler photometer

Jenkins

Peters²,

Murphy

2004

SPIE Proceedings

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The Kepler Mission is designed to characterize the frequency of Earth-sized planets in the habitable zones of solar-like stars in the solar galactic neighborhood by observing 100,000 main-sequence stars in a 100 square degree field of view (FOV) and seeking evidence of transiting planets. As part of the system engineering effort, we have developed an End-ToEnd Model (ETEM) of the photometer to better characterize the expected performance of the instrument and to guide us in making design trades. This model incorporates engineering information such as the point spread function, time histories of pointing offsets, operating temperature, quantization noise, the effects of shutterless readout, and read noise. Astrophysical parameters, such as a realistic distribution of stars vs. magnitude for the chosen FOV, zodiacal light, and cosmic ray events are also included. For a given set of design and operating parameters, ETEM generates pixel time series for all pixels of interest for a single CCD channel of the photometer. These time series are then processed to form light curves for the target stars and the impact of various noise sources on the combined differential photometric precision can be determined. This model is of particular value when investigating the effects of noise sources that cannot be easily subjected to direct analysis, such as residual pointing offsets, thermal drift or cosmic ray effects. This version of ETEM features extremely efficient computation times relative to the previous version while maintaining a high degree of fidelity with respect to the realism of the relevant phenomena.

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“…With its simpler pixels, a CCD will experience very little intra-pixel non-uniformity as most photons will interact with a depleted region of silicon, but it is not a negligible effect [9]. Photons incident upon CMOS pixels, with their more complex internal structure, have a chance of interacting with silicon that is part of the readout circuitry [10].…”

Section: Photo Response Non-uniformitymentioning

confidence: 99%

PSF and non-uniformity in a monolithic, fully depleted, 4T CMOS image sensor

Ivory¹,

Stefanov²,

Turner³

et al. 2018

High Energy, Optical, and Infrared Detectors for Astronomy VIII

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Lateral charge diffusion is one of the main contributors to the Point Spread Function (PSF) in CMOS image sensors, due to the small depth to which they can be depleted. This can have an adverse effect on the spatial resolution of the sensor and the measured shape of the observed object. In this paper, PSF measurements are made on a novel CMOS detector capable of reverse bias and full depletion. The PSF is measured with the Virtual Knife Edge (VKE) technique at five wavelengths, from 470 nm to 940 nm, to ascertain wavelength dependence. The inter-and intra-pixel non-uniformity is examined to determine the difference between pixels as well as within the pixels themselves. Finally, the pixel structure is also evaluated using a 1 µm spot of light to examine the effect of the internal layout of a pixel on the sensitivity to light. These factors all impact precision astronomical measurements and so need to be understood before use in science missions.

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<title>Nonuniformity of CCDs and the effects of spatial undersampling</title>

Cited by 26 publications

References 0 publications

Intra-Pixel Sensitivity Variation and Charge Transfer Inefficiency — Results of CCD Scans

Intra-Pixel Sensitivity Variation and Charge Transfer Inefficiency — Results of CCD Scans

An efficient end-to-end model for the Kepler photometer

PSF and non-uniformity in a monolithic, fully depleted, 4T CMOS image sensor

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