&lt;title&gt;Laser deposition of SmCo thin film on steel substrate&lt;/title&gt;

Allocca, Luigi; Gambardella, U.; Morone, A.; Valentino, M.

doi:10.1117/12.786979

Cited by 3 publications

(5 citation statements)

References 24 publications

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“…For this reason in figure 3 only the diffraction lines of steel substrate are reported. The presence of SmCo in the deposited film on steel substrate has been detected in EDX analysis reported in [9]. In detail, the SmCo crystallographic orientations (112), ( 120) and ( 222) overlap the steel (311), (400) and (113), respectively, as confirmed by the database reported in [9].…”

Section: Resultssupporting

confidence: 56%

“…The presence of SmCo in the deposited film on steel substrate has been detected in EDX analysis reported in [9]. In detail, the SmCo crystallographic orientations (112), ( 120) and ( 222) overlap the steel (311), (400) and (113), respectively, as confirmed by the database reported in [9]. In other terms, the thin film is grown with the c-axis tilted with respect to the substrate plane.…”

Section: Resultsmentioning

confidence: 55%

“…The substrate dimensions were 415 × 10 −6 m 2 for polycarbonate, steel, quartz, and 25 × 10 −6 m 2 for silicon. Each film has been realized without any seed layer fabrication [9]. The typical thickness of the deposited films is in the range of 0.5-5 µm.…”

Section: Resultsmentioning

confidence: 99%

“…magneto-optical or vibrating sample magnetometer (VSM), consist in the improvement of parameters such as magnetic field sensitivity, spatial resolution, frequency response, linearity and thermal stability. Unlike the previous paper [9], where the SQUID magnetometer has been successfully used to detect the 0031-8949/08/058114+06$30.00 Even if GMR-based magneto-resistive sensors are not as intrinsically sensitive as SQUIDs, in practice these devices offer good thermal stability, lower power consumption and wider linear range of operation (from dc to 1 MHz). Moreover, GMR sensors show a high spatial resolution, generally better than 100 µm 2 , due to the small size of the magnetic sensitive area.…”

Section: Introductionmentioning

confidence: 99%

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Laser deposition of SmCo thin film and coating on different substrates

et al. 2008

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Thin films and coatings of permanent magnetic materials are very important for different electronic and micromechanical applications. This paper deals with the fabrication, using pulsed laser deposition (PLD) technique, of good quality magnetic SmCo thin films on polycarbonate, steel, silicon and amorphous quartz substrates, for low cost electronic applications like radio frequency identification (RFID) antennas and electromechanical devices for fuel feeding control in the automotive. X-ray fluorescence and magnetic scanning measurements using giant magneto-resistive (GMR) sensors have been performed to study the functional magnetic properties of the deposited thin films.

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Section: Resultssupporting

confidence: 56%

Section: Resultsmentioning

confidence: 55%

Section: Resultsmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

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Laser deposition of SmCo thin film and coating on different substrates

et al. 2008

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“…The possibilities of X-ray techniques for analyzing Sm-Co materials have been described in the literature: X-ray absorption spectroscopy (XAS) [34][35][36], micro X-ray fluorescence (µXRF) [37], energy dispersive X-ray fluorescence (EDXRF) [38][39][40][41][42] and total X-ray fluorescence (TXRF) [43][44][45]. These publications are mainly devoted to the study of the structural features of magnetic materials [43], synthesis, [45][46][47], technological processes [36,42] and thin film analysis [35,36,40], while X-ray fluorescence is used only as a primary characterization.…”

Section: Introductionmentioning

confidence: 99%

X-ray Fluorescence Analysis of Waste Sm-Co Magnets: A Rational Approach

Arkhipenko,

Marina,

Doronina

et al. 2023

Recycling

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Determination of the chemical composition of waste Sm-Co magnets is required for their efficient recycling. The non-stereotypical composition of said magnets makes an analysis extremely challenging. X-ray fluorescence spectrometry is a promising analytical tool for this task. It offers high accuracy and simplicity of sample preparation as it does not require sample dissolution. However, a serious limitation of X-ray fluorescence analysis is the spectral interference of matrix elements and impurities. In this work, a two-stage technique has been developed for the determination of the main components (Sm, Co) and impurities (Fe, Cu, Zr, Hf, Ti, Ni, Mn, Cr) in samples of spent samarium–cobalt magnets using wavelength dispersive X-ray fluorescence spectrometry. In order to overcome the main limitation of the chosen method and to maximize its capabilities of qualitative and quantitative analysis, we propose an approach to the selection of analytical lines and experimental conditions, as well as a preparation method for the calibration standards. The obtained results have been shown to have a good correlation with ICP-OES. The limits of detection are in the range of 0.001–0.02 wt%, and the limits of quantification are 0.003–0.08 wt%.

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