&lt;title&gt;High-speed, low-noise, fine-resolution TDI CCD imagers&lt;/title&gt;

Chamberlain, S.G.; Washkurak, William D.

doi:10.1117/12.19453

Cited by 21 publications

(10 citation statements)

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“…Superposition of N-pixel signals, square root N times signal to noise ratio will be got in theory [27,28] . CCD technology, due to the characteristics of noiseless charge handling, was firstly used to design and implement TDI functions [29][30][31] . When the CMOS process used to implement the read out circuit, Bucket-brigade device (BBD)technology [32] can be used.…”

Section: Signal Processing On Chipmentioning

confidence: 99%

Study on infrared detection data read out technologies

Yongquan

Bi³

2011

SPIE Proceedings

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Read out circuit is a critical component needed for infrared and visible light imaging system. Advances in image sensors and microelectronics have led to the development of digital read out fabricated using deep sub micro integrated circuit techniques. An brief review is given of the image sensor developing. Major adaptation circuit are review including source follower, direct injection, and capacitance trans impedance amplifier. On chip analog signal processing and analog to digital conversion techniques are also discussed. Noise shaping modulation is a promising technique to build a low power, ultra small area, high precision pixel level AD convertor.

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Section: Signal Processing On Chipmentioning

confidence: 99%

Study on infrared detection data read out technologies

Yongquan

Bi³

2011

SPIE Proceedings

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“…Such a degradation of the MTF in ThI mode is expected from the non-continuous motion of the charge during the transfer through the CCD [2,3]. The MTF degradation caused by this non-continuous motion of the charge can be computed by Fourier transform in one direction on a rectangular profile, representing the image motion during one charge transfer (1/4 pixel in case of a four phase transport clock).…”

Section: Discussionmentioning

confidence: 99%

<title>MTF measurements of a frame transfer CCD operating in TDI mode</title>

Verhoeff

Gondoin

1992

SPIE Proceedings

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A simulation set-up, radiometrically representative of a high resolution Earth observation condition from a geosynchronous spinning spacecraft has been built. This simulation set-up is used to verify the performance of a commercially matrix CCD (THOMSON-CSF type TH7864) when operating in time delay and integration (ThI) mode. MTF measurements results of this TDI operating CCD are presented in this paper and are compared with M'TF values of the same CCD operating in a conventional staring mode.

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“…A variety of time delay and integration (TDI) arrays have been developed [1][2][3]. A TDI image sensor offers significant improvement in performance over a linear sensor with respect to sensitivity.…”

Section: Introductionmentioning

confidence: 99%

High-speed dual-output-channel stage-selectable TDI CCD image sensor for high-resolution applications

et al. 1995

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TDI sensors are a proven means of increasing the responsivity in a line scan imaging application. This paper describes the development of a family of high speed 96 stage TDI sensors. The sensor is available in a high resolution 2048 element version. A 512 element part will also be made. The number of TDI stages in the sensor can be selected in blocks of 6, 12, 24, 48, and 96 stages thus providing optimum sensitivity and performance over a wide range of illumination conditions. The device is fabricated using double metal, triple poly, buried channel, NMOS CCD process. The imaging region is 4-phase, 2-poiy for maximum charge storage and optimum MTF. The pixel pitch on the sensor is l3jim. The sensor employs a dual channel, 2-phase, 2-poly output shift register for high speed read-out. This technique enables halving the driving clock frequency thus reducing the power consumption which can be a severe problem at large data rates. Another benefit of dual channels is that each horizontal CCD (HCCD) pixel corresponds to two vertical CCD (VCCD) registers. As a result the charge storage capacity of the HCCD is doubled without having to increase the register width. The developed sensor operates at a combined data rate of up to 40MHz. The maximum line speeds are 32,000 and 14,000 lines/sec for the 5 1 2 and 2048 element parts respectively. Methods to reduce the fixed pattern noise resulting from transfer inefficiencies between the two HCCD channels have been implemented.

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<title>High-speed, low-noise, fine-resolution TDI CCD imagers</title>

Cited by 21 publications

References 0 publications

Study on infrared detection data read out technologies

Study on infrared detection data read out technologies

<title>MTF measurements of a frame transfer CCD operating in TDI mode</title>

High-speed dual-output-channel stage-selectable TDI CCD image sensor for high-resolution applications

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