2001
DOI: 10.1117/12.450743
|View full text |Cite
|
Sign up to set email alerts
|

<title>Effect of twin boundaries on the spectroscopic performance of CdZnTe detectors</title>

Abstract: Most single grains in cadmium zinc telluride (CdZnTe) grown by the high-pressure Bridgman (HPB) technique contain multiple twin boundaries. As a consequence, twin boundaries are one of the most common macroscopic material defects found in large area (400 to 700 mm z) CdZnTe specimens obtained from HPB ingots. Due to the prevalence of twin boundaries, understanding their effect on detector performance is key to the material selection process. Twin boundaries in several 2 mm thick large area specimens were first… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1
1

Citation Types

0
3
0

Year Published

2003
2003
2023
2023

Publication Types

Select...
5
3

Relationship

1
7

Authors

Journals

citations
Cited by 10 publications
(3 citation statements)
references
References 4 publications
(2 reference statements)
0
3
0
Order By: Relevance
“…We were able to achieve these large dimensions for our detector with the aid of IR scanning and X-ray screening techniques that allowed us to examine CZT wafers in order to find large homogeneous pieces without defects. 5,6 The first generation detector system tested at Goddard was based on a University of Arizona ASIC designed for medical imaging. This ASIC utilized an integrating amplifier mechanism which read out every pixel each readout cycle, had a 64×64 array of 380 µm pixels, and was constructed so that the CZT detector could be directly connected to the ASIC using indium bump bonding.…”
Section: Detector Test Resultsmentioning
confidence: 99%
“…We were able to achieve these large dimensions for our detector with the aid of IR scanning and X-ray screening techniques that allowed us to examine CZT wafers in order to find large homogeneous pieces without defects. 5,6 The first generation detector system tested at Goddard was based on a University of Arizona ASIC designed for medical imaging. This ASIC utilized an integrating amplifier mechanism which read out every pixel each readout cycle, had a 64×64 array of 380 µm pixels, and was constructed so that the CZT detector could be directly connected to the ASIC using indium bump bonding.…”
Section: Detector Test Resultsmentioning
confidence: 99%
“…Producers of CdZnTe have incrementally improved performance, and large detector wafers (~10 cm 2 ) are now available, albeit with the use of careful mapping and selection techniques. 1,2 More recently, Yinnel Tech 3 (CdZnTe) and Acrorad 4 (CdTe) have developed seeded growth techniques that produce ingots that are mostly one single crystal with potentially high detector uniformity and improved yield of large detector substrates. The cost of CdZnTe/CdTe has slowly come down, but these materials are still very expensive compared to scintillators.…”
Section: Semiconductor Detectorsmentioning
confidence: 99%
“…CdZnTe is proved to be the most promising material for room temperature X-ray and gamma ray detectors [1] . However, grain boundary limits the performance and the yield of large-volume detectors [2] . In addition,there exists a few studies exploring the electric field distribution in CdZnTe detectors.…”
Section: Introductionmentioning
confidence: 99%