&lt;title&gt;Diode laser based infrared scene projector&lt;/title&gt;

Beasley, D. Brett; Cooper, John B.; Mobley, Scott B.; Buford, James A.

doi:10.1117/12.210629

“…The SHaRRP hardware included a staring 256X256 InSb sensor with a passband filter of 4.4-4.96 µm. The results of the test indicated that the performance of the projector equaled or exceeded the specifications reported by the authors at SPIE last year3 . The following table presents a summary of the test results as reported by ASG:…”

mentioning

confidence: 54%

“…Last year we reported on the delivery of the prototype laser diode based infrared scene projector. 1 The projector was developed under a Phase II SBIR contract and delivered to USAMICOM's RDEC in January 1995. Over the course of this last year the performance of the prototype projector has been evaluated by an independent user, and design modifications have been made to improve the performance of the projector.…”

Section: Introductionmentioning

confidence: 99%

<title>Performance capabilities and utilization of MICOM's diode-laser-based infrared scene projector technology</title>

Beasley

¹

,

Cooper

²

1996

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This paper describes the current design characteristics and performance capabilities of the US Army Missile Command's (USAMICOM's) diode laser based infrared scene projector technology. The projector is now operational at the US Army Missile Command's Research, Development, and Engineering Center (RDEC) and is being integrated into several HWIL simulation facilities. The projector is based upon a linear array of Pb-salt diode lasers coupled with a high-speed optical scanning system, drive electronics and synchronization electronics. The projector design has been upgraded to generate 256X256 resolution scenes at 4 KHz frame rates, and the fabrication of a 544X544 projector is in progress. The projector system now includes real-time non-uniformity correction electronics and is interfaced with a real-time scene generation computer. In addition, a closed-cycle cryogenic cooling system has been added for increased dynamic range and maintenance-free operation. The system's modularity provides upgradability to meet specific performance requirements such as increased spatial resolution, different emission wavelengths, or dual-band scene projection. The projector's upgraded design and performance characteristics are presented in the paper, as well as sample images generated with the projector and captured by an InSb FPA sensor.Keywords: Infrared, Scene Projection, Diode lasers, Simulation, FPA testing, Hardware-in-the-loop. INTRODUCTIONLast year we reported on the delivery of the prototype laser diode based infrared scene projector.1 The projector was developed under a Phase II SBIR contract and delivered to USAMICOM's RDEC in January 1995. Over the course of this last year the performance of the prototype projector has been evaluated by an independent user, and design modifications have been made to improve the performance of the projector. The projector is presently being customized for integration into several HWIL simulation facilities at RDEC. SYSTEM DESIGNThe projector is a laser scanning system which consists of a linear array of Tunable Diode Lasers (TDLs) coupled with a high-speed optical scanning system and drive electronics. Like other scanning projector systems, the TDL projector takes advantage of the FPA's integration mechanism. The output intensity of each TDL is temporally modulated in synchronization with the scanning mirror to effectively "paint" a two-dimensional scene across the unit-under-test's (UUT's) FOV. As the image of the TDL array is scanned across the FPA, the appropriate amount of energy is deposited onto each detector to generate the simulated scene. The projector must scan over each FPA detector at least once during its minimum integration time. In addition, the

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“…Detailed design and performance information is contained in the references. 2,3,4,5 Currently, three LDAP systems are operational within the AMCOM MRDEC. These systems have been used to test several missile seekers of various formats and wavebands.…”

Section: Laser Diode Array Projector (Ldap)mentioning

confidence: 99%

<title>Application of multiple IR projector technologies for AMCOM HWIL simulations</title>

Beasley

¹

,

Saylor

²

1999

SPIE Proceedings

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This paper describes the application of multiple IR projector technologies to Hardware-in-the-Loop (HWIL) simulations at the US Army Aviation and Missile Command's (AMCOM) Missile Research, Development, and Engineering Center (MRDEC). Several projectors utilizing a variety of emerging technologies are currently being successfully applied within the HWIL facilities of AMCOM's MRDEC. Projector technologies utilized at AMCOM include laser diode array projectors (LDAP), Honeywell's bright resistive infrared thermal emitter (BRITE) arrays, an IR zoom projector with thermoscenes, and steerable point source projectors. Future plans include a new resistor array projector called the Multispectral Infrared Animation Generation Equipment (MIRAGE), which is being manufactured by Santa Barbara Infrared. These projector technologies have been used to support multiple HWIL test entries of various seeker configurations. Seeker configurations tested include: two InSb 256x256 FPAs, an InSb 512x512 FPA, a PtSi 640x480 FPA, a PtSi 256x256 FPA, a HgCdTe 256x256 FPA, a scanning linear array, and an uncooled 320x240 microbolometer FPA. The application, capabilities, and performance of each technology are reviewed in the paper. Example imagery collected from each operational system is also presented.Keywords: Infrared, Scene Projection, Diode lasers, Simulation, FPA testing, Hardware-in-the-loop. INTRODUCTIONThe AMCOM Advanced Simulation Center (ASC) provides high-fidelity, value-added HWIL simulation support to Program Executive Officers (PEO) and Project Managers (PM) who are responsible for developing and fielding tactical precision guided missiles and submunitions for the U.S. Army. The ASC is also engaged in cooperative HWIL simulation tasks which support other DoD Agencies, NATO members and other U.S. Allies. This test support focuses primarily on testing missiles/munitions employing infrared, millimeter wave, and microwave sensors and seekers. 1The ASC facility is located on Redstone Arsenal, adjacent to Huntsville, Alabama. The ASC consists of 14 HWIL simulation facilities developed over a period of 25 years. These facilities contain special purpose computers, signal generation equipment, projectors, and radiation chambers, supported by signature measurement-based mathematical models. They provide targets signatures, countermeasures, and background scenarios in the microwave, millimeter wave, infrared and visible regions of the electromagnetic spectrum. Some of the programs currently supported include THAAD, Patriot, Army TACMS-BAT, Javelin, EFOG-M, TOW, Stinger, Longbow, and SADARM.The ASC has six simulation facilities for testing systems which utilize IR sensors or seekers. A photograph of one of the facilities is shown in Figure1. The ASC IR HWIL facilities are capable of generating dynamic in-band IR images in realtime using advanced IR projector and scene generation computer equipment. This paper provides an overview of the IR projector technologies utilized within the ASC and the performance capabilities of each s...

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“…1 The projector was developed under a Phase II SBIR contract and delivered to USAMICOM's RDEC in January 1995. Over the course of this last year the performance of the prototype projector has been evaluated by an independent user, and design modifications have been made to improve the performance of the projector.…”

Section: Introductionmentioning

confidence: 99%

Performance Capabilities and Utilization of MICOM's Diode Laser Based Infrared Scene Projector Technology

Beasley¹,

Cooper²

1996

Self Cite

0

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This paper describes the current design characteristics and performance capabilities of the US Army Missile Command's (USAMICOM's) diode laser based infrared scene projector technology. The projector is now operational at the US Army Missile Command's Research, Development, and Engineering Center (RDEC) and is being integrated into several HWIL simulation facilities. The projector is based upon a linear array of Pb-salt diode lasers coupled with a high-speed optical scanning system, drive electronics and synchronization electronics. The projector design has been upgraded to generate 256X256 resolution scenes at 4 KHz frame rates, and the fabrication of a 544X544 projector is in progress. The projector system now includes real-time non-uniformity correction electronics and is interfaced with a real-time scene generation computer. In addition, a closed-cycle cryogenic cooling system has been added for increased dynamic range and maintenance-free operation. The system's modularity provides upgradability to meet specific performance requirements such as increased spatial resolution, different emission wavelengths, or dual-band scene projection. The projector's upgraded design and performance characteristics are presented in the paper, as well as sample images generated with the projector and captured by an InSb FPA sensor.Keywords: Infrared, Scene Projection, Diode lasers, Simulation, FPA testing, Hardware-in-the-loop. INTRODUCTIONLast year we reported on the delivery of the prototype laser diode based infrared scene projector.1 The projector was developed under a Phase II SBIR contract and delivered to USAMICOM's RDEC in January 1995. Over the course of this last year the performance of the prototype projector has been evaluated by an independent user, and design modifications have been made to improve the performance of the projector. The projector is presently being customized for integration into several HWIL simulation facilities at RDEC. SYSTEM DESIGNThe projector is a laser scanning system which consists of a linear array of Tunable Diode Lasers (TDLs) coupled with a high-speed optical scanning system and drive electronics. Like other scanning projector systems, the TDL projector takes advantage of the FPA's integration mechanism. The output intensity of each TDL is temporally modulated in synchronization with the scanning mirror to effectively "paint" a two-dimensional scene across the unit-under-test's (UUT's) FOV. As the image of the TDL array is scanned across the FPA, the appropriate amount of energy is deposited onto each detector to generate the simulated scene. The projector must scan over each FPA detector at least once during its minimum integration time. In addition, the

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<title>Diode laser based infrared scene projector</title>

Cited by 7 publications

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<title>Performance capabilities and utilization of MICOM's diode-laser-based infrared scene projector technology</title>

<title>Performance capabilities and utilization of MICOM's diode-laser-based infrared scene projector technology</title>

<title>Application of multiple IR projector technologies for AMCOM HWIL simulations</title>

Performance Capabilities and Utilization of MICOM's Diode Laser Based Infrared Scene Projector Technology

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