1997
DOI: 10.1117/12.283791
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<title>Development of grazing incidence multilayer mirrors for hard x-ray focusing telescopes</title>

Abstract: We are developing depth-graded, multilayer-coated mirrors for astrophysical hard X-ray focusing telescopes. In this paper, we discuss the primary technical challenges associated with the multilayer coatings, and report on progress to date. We h a v e sputtered constant d-spacing and depth-graded W Si multilayers onto 0.3 0.5 mm thick DURAN glass AF45 and D263 and 0.4 mm thick epoxy replicated aluminum foils ERAFs, both of which are potential mirror substrates. We have characterized the interfacial roughness, u… Show more

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Cited by 17 publications
(13 citation statements)
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“…It has been demonstrated for HEFT that one can tolerate a 5% change of the bilayer thicknesses across the mirror surfaces without a significant influence on the throughput and/or field of view of the telescopes. 18 The current baseline design for HEFT is that it will be made up of 600 segments rather than the 900 segments mounted on the current prototype.13 The 9Q0 segments, however, allowed us to probe the uniformity and quality of the coating up to and beyond the limits of the current HEFT baseline design. Figure 3 shows the measured reflectivity of mirror segment D3 taken at 34 keV for a number of values of the azimuthal position q.…”
Section: Uniformity Measurementsmentioning
confidence: 99%
“…It has been demonstrated for HEFT that one can tolerate a 5% change of the bilayer thicknesses across the mirror surfaces without a significant influence on the throughput and/or field of view of the telescopes. 18 The current baseline design for HEFT is that it will be made up of 600 segments rather than the 900 segments mounted on the current prototype.13 The 9Q0 segments, however, allowed us to probe the uniformity and quality of the coating up to and beyond the limits of the current HEFT baseline design. Figure 3 shows the measured reflectivity of mirror segment D3 taken at 34 keV for a number of values of the azimuthal position q.…”
Section: Uniformity Measurementsmentioning
confidence: 99%
“…) We are producing a new type of substrate by thermally forming glass 1, 3 . X-ray scattering measurements indicate the microroughness is 3.5 Å, and multilayers deposited on these substrates have similar microroughness 4 . This translates to higher reflectivity in the hard x-ray band compared to epoxy-replicated foils.…”
Section: Introductionmentioning
confidence: 95%
“…Hailey was especially interested in a substrate to which multilayers could be applied. For a W/Si multilayer, Mao et al [34] found that the interfacial roughness on glass (3.5-4.0Å) was lower than that on an epoxy replicated foil (4.5-5.0Å) (they did not try multilayer replication).…”
Section: Glass As a Substratementioning
confidence: 99%