&lt;title&gt;Determination of the refractive index profile of integrated optical waveguides from near-field measurements&lt;/title&gt;

Halfmann, M.; Sumichrast, L.; Heinlein, W.

doi:10.1117/12.637018

SPIE Proceedings

1992

DOI: 10.1117/12.637018

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<title>Determination of the refractive index profile of integrated optical waveguides from near-field measurements</title>

M. Halfmann

L. Sumichrast

W. Heinlein

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<title>Determination of the refractive index profile of integrated optical waveguides from near-field measurements</title>

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