&lt;title&gt;Dependence of plasma resistance on time in electro-discharge excimer lasers&lt;/title&gt;

Ануфрик, С. С.; Volodenkov, Alexander; Znosko, K. F.

doi:10.1117/12.660061

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“…3 C3-the peaking capacitor; C,, C2-the storage capacitors; RI-the spark-gap switch resistance; Li, L2, L3-the contour inductance; Le-the discharge inductance; R-the discharge resistance; Ce-the interelectrode capacity. To make a set of the equations (3) closed we should add to it the equations (1) or (2). The systems of equations (3) and (2) MathCad2000.…”

Section: Resultsmentioning

confidence: 99%

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Modeling of XeCl-laser excitation systems on storage capacitors

Ануфрик

Volodenkov

Znosko

Proceedings of LFNM 2005. 7th International Conference on Laser and Fiber-Optical Networks Modeling, 2005.

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With the purpose of reception of energy of generation 0,2-1 J, two types of electrodischarge XeCllaser excitation system with was created. The modeling procedure of XeCI-laser excitation systems is developed, allowing to calculate the form of a voltage pulse on laser electrodes and energy input in the active medium. The dependence of discharge gap resistance on time is usually simulated by exponential empirical dependence. In this case the breakdown voltage of inter-electrode gap must be taken from experimental data also. For each gas mixture, parameters of time dependence of discharge gap resistance and value of inter-electrode breakdown voltage have different values. Consequently, the results, which are obtained in this manner, have practical significance for definite gas ratio of mixture. We have developed the simple model, which takes into account the dependence of discharge gap parameters from gas pressure and composition. The solution of Boltzmann equation for electrons in electrical field (E/N) and calculation of kinetic processes may be carried out. In this case the effective rate of electrons formation may be approximated as function of gas composition and (E/N). Results ofone model are compared to results of other model and experimental data.

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Section: Resultsmentioning

confidence: 99%

“…The dependence of the resistance of active medium from time is taken by the next way [1,2]. 1. Usually during realization of the simple engineering approach to simulation of excitation system, dependence of the active medium resistance from time has been taken in the next form R(t) = RI + (R -RI).…”

Section: Resultsmentioning

confidence: 99%