1994
DOI: 10.1117/12.177418
|View full text |Cite
|
Sign up to set email alerts
|

<title>Compact optical delay line rf filter using a surface-emitting laser diode array</title>

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1

Citation Types

0
1
0

Year Published

1995
1995
1995
1995

Publication Types

Select...
1

Relationship

0
1

Authors

Journals

citations
Cited by 1 publication
(1 citation statement)
references
References 0 publications
0
1
0
Order By: Relevance
“…Our test setup gave us current versus voltage for each of the 64-elements, thereby assuring us before the actual testing started, that all of the 64-elements were operative. Our characterization consisted of testing each element, to each one of the four different grounding pins (1,18,35, and 52). The VCSEL was connected through an SMU 3 (Ground) and SMU 1 (Source) to an HP 16058-60003 Personality Board, which was then connected to an HP 4145B Semiconductor Parameter Analyzer with a GPIB to an HP 7090A Measuring Plotting System.…”
Section: Characteristics Of Experimental 64-element Tapped Delay Linementioning
confidence: 99%
“…Our test setup gave us current versus voltage for each of the 64-elements, thereby assuring us before the actual testing started, that all of the 64-elements were operative. Our characterization consisted of testing each element, to each one of the four different grounding pins (1,18,35, and 52). The VCSEL was connected through an SMU 3 (Ground) and SMU 1 (Source) to an HP 16058-60003 Personality Board, which was then connected to an HP 4145B Semiconductor Parameter Analyzer with a GPIB to an HP 7090A Measuring Plotting System.…”
Section: Characteristics Of Experimental 64-element Tapped Delay Linementioning
confidence: 99%