&lt;title&gt;Accurate shape measurement for cylindrical object by phase-shifting method using Fourier transform&lt;/title&gt;

Fujigaki, Motoharu; Morimoto, Yoshiharu

doi:10.1117/12.269876

Cited by 6 publications

(5 citation statements)

References 8 publications

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“…number gives the maximum number of optical arrangements used in this study. Morimoto has shown that its method works properly using six images and Fourier transform . In photoelasticimetry, the authors usually uses the fast Fourier transform with eight images minimum.…”

Section: Methodsmentioning

confidence: 99%

“…Morimoto has shown that its method works properly using six images and Fourier transform. [18] In photoelasticimetry, the authors usually uses the fast Fourier transform with eight images minimum. The maximum number of optical arrangements is defined by the authors and can be increased for several techniques; however, it is intentionally configured to 32 and 60 for the isoclinic and isochromatic algorithms respectively in order to compare them with an equivalent number of optical arrangements.…”

Section: Benchmark Description and Theoretical Recallmentioning

confidence: 99%

See 1 more Smart Citation

Analysis and comparison of different methods used to extract isoclinic and isochromatic parameters. Application to the determination of the residual stresses inside crystal silicon wafers

Jagailloux

Valle

2018

Strain

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The present work focuses on an experimental analysis of different photoelastic extraction methods. An adapted test rig designed in order to evaluate several extraction methods, which come from the literature and 2 new proposed methods. Their comparisons point out dissimilar behaviours between them in an experimental environment. However, some specific cases require the use of most appropriate techniques to minimise the defects influence. Therefore, a specific application of the photoelasticity is presented to illustrate the meaning of the technique used. It mainly focuses on the determination of the residual stresses and their orientation inside photovoltaic crystal silicon wafers.

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Section: Methodsmentioning

confidence: 99%

Section: Benchmark Description and Theoretical Recallmentioning

confidence: 99%

Analysis and comparison of different methods used to extract isoclinic and isochromatic parameters. Application to the determination of the residual stresses inside crystal silicon wafers

Jagailloux

Valle

2018

Strain

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“…In order to unwrap the phase, some methods using additional gratings or a special grating with different pitches were proposed [3][4][5][6]. If we use multiple gratings by changing them [5], it is difficult to perform real-time analysis because of time-consuming for grating switching. We also developed the frequency modulation grating projection method [6].…”

Section: Introductionmentioning

confidence: 99%

Real-Time Shape Measurement by Unwrapping Method Using Aliasing

Fujigaki

Toyotake

Matui

et al. 2006

KEM

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We previously proposed a real-time shape measurement method using two-component synthesis grating projection. In the method, phase unwrapping of the projected grating is performed by using aliasing of the Fourier spectrum of the grating images. It requires only 5 images obtained for one-cycle phase-shifting. Each phase in the two-component can be extracted from only 5 phase-shifted grating images. In this paper, we propose a real-time shape measurement system. The theory, the algorithm for the analysis and the experimental results are shown.

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“…For a detailed explanation of both the calibration processes and the measurement procedures of the grating projection method, refer to the previously reported studies. [11][12][13][14] 2.3. Experimental cases Table 2 lists the experimental cases.…”

Section: Constructed Measurement Systemmentioning

confidence: 99%

“…Accordingly, numerous studies have been reported in the last two decades. [5][6][7][8][9][10][11] Some studies 2,[12][13][14] focus upon photogrammetric measurement using a grating projection method as a full-field surface shape measurement method with high accuracy and high spatial resolution for space structures. In our past studies, [8][9][10][11] we conducted surface shape measurements of various space structures, including a honeycomb panel, polyimide film, glass-ceramic spherical mirror model, and circle-formed flat plate model coated with the material of S13GP:6N/LO-1.…”

Section: Introductionmentioning

confidence: 99%

Random Error Reduction Method for One-shot Shape Measurement using the Grating Projection Method

Iwasa

Tanaka

Fujigaki

2015

Trans. Japan Soc. Aero. S Sci.

Self Cite

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This paper proposes a measurement method to capture the surface profiles of vibrating objects with high spatial resolution. The proposed method is a one-shot surface shape measurement using a grating projection method, which incorporates a Wiener filter to reduce the random error. The measured objects are a white flat plate and a polyimide film with wrinkles. The random errors treated in this study are error components that appear in the depth direction of the photogrammetric measurement. By experimental measurement of stationary objects, it is clarified that the spatial distribution of random errors is roughly Gaussian. On the basis of this result, a Wiener filter is applied as a random error reduction method for the one-shot surface shape measurement using the grating projection method. Its effectiveness is discussed by conducting the shape measurement of the white plate model and the polyimide film. The results show that the proposed method can remove random errors from the measurement results with the same effectiveness as a traditional averaging procedure. Moreover, it is also shown that the proposed method can appropriately reduce random errors in the surface shape measurement results of vibrating objects.

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<title>Accurate shape measurement for cylindrical object by phase-shifting method using Fourier transform</title>

Cited by 6 publications

References 8 publications

Analysis and comparison of different methods used to extract isoclinic and isochromatic parameters. Application to the determination of the residual stresses inside crystal silicon wafers

Analysis and comparison of different methods used to extract isoclinic and isochromatic parameters. Application to the determination of the residual stresses inside crystal silicon wafers

Real-Time Shape Measurement by Unwrapping Method Using Aliasing

Random Error Reduction Method for One-shot Shape Measurement using the Grating Projection Method

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