2019
DOI: 10.2343/geochemj.2.0559
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<i>In situ</i> analyses of hydrogen and sulfur isotope ratios in basaltic glass using SIMS

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Cited by 7 publications
(3 citation statements)
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“…The details of the analytical procedures, including sample preparation, analytical conditions, and standard data, are provided in Refs. 20 , 21 and “ Methods ”. The volatile and major elemental compositions and the δD‰ values of the melt inclusions are listed in Supplementary Table S2 .…”
Section: Resultsmentioning
confidence: 99%
See 1 more Smart Citation
“…The details of the analytical procedures, including sample preparation, analytical conditions, and standard data, are provided in Refs. 20 , 21 and “ Methods ”. The volatile and major elemental compositions and the δD‰ values of the melt inclusions are listed in Supplementary Table S2 .…”
Section: Resultsmentioning
confidence: 99%
“…The same microprobe as above was used, and a method described in Ref. 21 was followed. We used a 20 keV Cs + ion beam of ~ 5 nA defocused to ~ 15 µm in diameter.…”
Section: Methodsmentioning
confidence: 99%
“…Secondary ion mass spectrometry (SIMS) is an in situ micro−analytical technique combining high spatial resolution with high sensitivity that is particularly well suited for determining the concentrations and isotopic compositions of light elements (H, Li, B, C, N, O, S) while overcoming many of the challenges involved with bulk analyses. Despite extensive efforts to analyze the isotopic compositions of volatiles in volcanic glasses such as hydrogen (e.g., Hauri et al, 2002Hauri et al, , 2006, sulfur (e.g., Shimizu et al, 2019), and chlorine (e.g., Layne et al, 2004) by the latest generation of SIMS, carbon isotopes have been largely ignored following earlier attempts (Hauri et al, 2002) due to its high background signal (e.g., Ihinger et al, 1994). In addition, the matrix effect for carbon isotope that affects the accuracy of SIMS measurements (e.g., Hauri et al, 2002) remains largely unexplored.…”
Section: Introductionmentioning
confidence: 99%