“…Secondary ion mass spectrometry (SIMS) is an in situ micro−analytical technique combining high spatial resolution with high sensitivity that is particularly well suited for determining the concentrations and isotopic compositions of light elements (H, Li, B, C, N, O, S) while overcoming many of the challenges involved with bulk analyses. Despite extensive efforts to analyze the isotopic compositions of volatiles in volcanic glasses such as hydrogen (e.g., Hauri et al, 2002Hauri et al, , 2006, sulfur (e.g., Shimizu et al, 2019), and chlorine (e.g., Layne et al, 2004) by the latest generation of SIMS, carbon isotopes have been largely ignored following earlier attempts (Hauri et al, 2002) due to its high background signal (e.g., Ihinger et al, 1994). In addition, the matrix effect for carbon isotope that affects the accuracy of SIMS measurements (e.g., Hauri et al, 2002) remains largely unexplored.…”