2018
DOI: 10.3791/55897
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<em>In Situ</em> Monitoring of the Accelerated Performance Degradation of Solar Cells and Modules: A Case Study for Cu(In,Ga)Se<sub>2</sub> Solar Cells

Abstract: The levelized cost of electricity (LCOE) of photovoltaic (PV) systems is determined by, among other factors, the PV module reliability. Better prediction of degradation mechanisms and prevention of module field failure can consequently decrease investment risks as well as increase the electricity yield. An improved knowledge level can for these reasons significantly decrease the total costs of PV electricity. In order to better understand and minimize the degradation of PV modules, the occurring degradation me… Show more

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Cited by 6 publications
(6 citation statements)
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“…The layer stack of the CIGS solar cells used is: 1mm soda-lime glass, 500 nm DC-sputtered molybdenum, 2 µm coevaporated CIGS, 50 nm chemical bath deposited cadmium sulfide, 65 nm DC sputtered intrinsic zinc oxide, 1 or 2 µm DC sputtered aluminum doped zinc oxide and 60 nm thermally evaporated gold contacts to the sides. A detailed description of the cell design and fabrication procedure can be found in [7].…”
Section: Methodsmentioning
confidence: 99%
“…The layer stack of the CIGS solar cells used is: 1mm soda-lime glass, 500 nm DC-sputtered molybdenum, 2 µm coevaporated CIGS, 50 nm chemical bath deposited cadmium sulfide, 65 nm DC sputtered intrinsic zinc oxide, 1 or 2 µm DC sputtered aluminum doped zinc oxide and 60 nm thermally evaporated gold contacts to the sides. A detailed description of the cell design and fabrication procedure can be found in [7].…”
Section: Methodsmentioning
confidence: 99%
“…A schematic of the cell design is given in Figure 1. More information on the cell design and manufacturing proces can be found in previous work [10,11] and a description of the 3-stage CIGSe co-evaporation process is given by Couzinie-Devy et al [12]. For this study ten samples from three different CIGSe deposition runs were used.…”
Section: 1mentioning
confidence: 99%
“…To investigate the impact of the third component on the device stability, accelerated long-term stability tests are carried out for the reference devices and for the optimized devices of each series. , The I – V measurements are performed periodically on the device for around 4 h under illumination in ambient conditions. The temporal evolution of the photovoltaic parameters J SC , V OC , FF, and PCE is extracted from the I – V measurements and plotted in Figure .…”
Section: Results and Discussionmentioning
confidence: 99%