Low-voltage TEM imaging of polymer blends

Lednický, F.; Coufalová, E.; Hromádková, Jiřina; Delong, A.; Kolařík, Vladimír

doi:10.1016/s0032-3861(99)00711-9

Cited by 36 publications

(22 citation statements)

References 6 publications

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“…The main advantage of this method consists in the use of an accelerating voltage around 5 kV with final light microscope magnification of an electron-microscopical image. It delivers nearly twenty times more image contrast enhancement than a high voltage electron microscope using accelerating voltage 100 kV (Lednicky et al, 2000). In the case of biological specimens, staining procedures can therefore be omitted.…”

Section: Electron Transmission Through the Thin Samplesmentioning

confidence: 99%

Monte-Carlo Simulation in Electron Microscopy and Spectroscopy

Starý¹

2011

Applications of Monte Carlo Method in Science and Engineering

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Section: Electron Transmission Through the Thin Samplesmentioning

confidence: 99%

Monte-Carlo Simulation in Electron Microscopy and Spectroscopy

Starý¹

2011

Applications of Monte Carlo Method in Science and Engineering

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“…Only recently we have had TEM operating down to several keV at high resolution, 3) and thus light element composed, unstained samples like polymers or organic molecules can be observed. 4,5) In addition to the directly imaging TEM devices, the scanning TEM (STEM) version has existed for decades within the same PE range with not very frequently met dedicated devices but with many STEM attachments to the TEM. More recently, even standard SEMs with PE up to 30 keV are equipped with detectors, the ''bright'' and the ''dark'' field ones, of transmitted electrons, inserted to below the specimen like in a dedicated STEM.…”

Section: Ref 1))mentioning

confidence: 99%

Very Low Energy Scanning Electron Microscopy of Free-Standing Ultrathin Films

et al. 2010

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Institute of Scientific Instruments of the ASCR, v.v.i., Královopolská 147, 612 64 Brno, Czech Republic Instrument and methodology is presented for very low energy scanning transmission electron microscopy. The detector system provides simultaneous acquisitions of total reflected and transmitted electron fluxes. Introductory experiments incorporated examination of ultrathin foils of gold, carbon and graphene flakes. Extremely sensitive thickness contrast obtained at units of eV is demonstrated. The phenomenon of electron transmissivity apparently exceeding 100% owing to the contribution of secondary electrons released near to the exit surface is described and discussed.

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“…For example, Nakagawa et al (2002) illustrated subgrains and dislocations in semiconductors and Shimizu et al (2004) observed extinction contours in bright-field LV-STEM images of aluminium films. Lednick et al (2000) also speculated that diffraction had contributed to contrast in LV-STEM images of crystalline polymer samples. Although this contrast is useful if found, the lack of flexibility in movement of electron detectors relative to the foil and also in tilting of the foil during experiments currently limits the usefulness of diffraction contrast in LV-STEM work.…”

Section: Diffraction Contrastmentioning

confidence: 99%

Scanning transmission electron microscopy using a SEM: Applications to mineralogy and petrology

Lee

Smith

2006

Mineral. mag.

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High-resolution imaging of electron-transparent samples using a scanning electron microscope, here termed low voltage (LV) STEM, is a new and valuable technique for studying Earth and planetary materials. The most effective method of LV-STEM imaging uses a pair of electron detectors positioned side-by-side beneath the thin sample. The detector directly underlying the sample forms bright-field images dominated by mass-thickness contrast. Activation of the detector offset from the sample yields dark-field images with a greater component of atomic number contrast. LV-STEM images with significant diffraction contrast can also be obtained, but require careful positioning of the sample relative to the electron detectors. In this study LV-STEM was used successfully to image sub-mm sized kaolinite crystals and tens of nm-sized etch pits on the gold-coated surfaces of weathered feldspar grains. Dark-field LV-STEM was also especially effective for characterizing very fine-scale intergrowths of Mg-and Fe-rich phyllosilicates within uniformly thin samples of the Murchison meteorite prepared using the focused ion beam (FIB) technique. LV-STEM is a quick and easy method for characterizing the morphology and internal structure of mineral and rock samples and may prove to be especially useful in geomicrobiology research.

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Low-voltage TEM imaging of polymer blends

Cited by 36 publications

References 6 publications

Monte-Carlo Simulation in Electron Microscopy and Spectroscopy

Monte-Carlo Simulation in Electron Microscopy and Spectroscopy

Very Low Energy Scanning Electron Microscopy of Free-Standing Ultrathin Films

Scanning transmission electron microscopy using a SEM: Applications to mineralogy and petrology

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