2016
DOI: 10.1021/acs.jpcc.6b05575
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Low Valence Cation Doping of Bulk Cr2O3: Charge Compensation and Oxygen Vacancy Formation

Abstract: ABSTRACT:The different oxidation states of chromium allow its bulk oxide form to be reducible, facilitating the oxygen vacancy formation process, which is a key property in applications such as catalysis. Similar to other useful oxides such as TiO 2 , and CeO 2 , the effect of substitutional metal dopants in bulk Cr 2 O 3 and its effect on the electronic structure and oxygen vacancy formation are of interest, particularly in enhancing the latter. In this paper, density functional theory (DFT) calculations with… Show more

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Cited by 61 publications
(36 citation statements)
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References 83 publications
(181 reference statements)
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“…Under such conditions, Cr i defects have lower formation energy compared to V Cr and both Cr i and V O have formation energies approximately equal to 1.5 eV, making Cr i and V O the dominant defects. Similarly, bulk Cr 2 O 3 samples can be strongly p-type doped with E F close to VBM, when divalent ions such as Mg are present as impurities [40]. Under such conditions, our calculations suggest that Cr i could be the dominant defect in bulk Cr 2 We have studied the diffusion of Cr and O interstitials in charge states ranging from [0, 3] and [-2, 0], respectively.…”
Section: Interstitialsmentioning
confidence: 93%
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“…Under such conditions, Cr i defects have lower formation energy compared to V Cr and both Cr i and V O have formation energies approximately equal to 1.5 eV, making Cr i and V O the dominant defects. Similarly, bulk Cr 2 O 3 samples can be strongly p-type doped with E F close to VBM, when divalent ions such as Mg are present as impurities [40]. Under such conditions, our calculations suggest that Cr i could be the dominant defect in bulk Cr 2 We have studied the diffusion of Cr and O interstitials in charge states ranging from [0, 3] and [-2, 0], respectively.…”
Section: Interstitialsmentioning
confidence: 93%
“…It is noteworthy, that Cr 2 O 3 passivation films on Ni alloy substrate could be p-type doped due to trace amounts of Ni substitution [40]. For Ni doping, Fermi level in Cr 2 O 3 stabilizes at 0.4 eV above VBM [40]. Under such conditions, Cr i defects have lower formation energy compared to V Cr and both Cr i and V O have formation energies approximately equal to 1.5 eV, making Cr i and V O the dominant defects.…”
Section: Interstitialsmentioning
confidence: 99%
“…A Monkhorst-Pack (2×1×1) k-point sampling grid is used. For consistency with previous work we apply the DFT+U approach [58] to describe the Ti 3d and Cr 3d states, with U = 4.5 eV for the Ti 3d states and 3.5 eV for the Cr 3d states [59,60]. Convergence criteria for electronic and ionic relaxations are 0.0001 eV and 0.02 eV/ Å.…”
Section: Methodsmentioning
confidence: 98%
“…In addition, in previous studies, we found that this correction is necessary to describe O 2p states that result after valence band hole formation. 30,31,69 Finally, the partially filled 3d states in Cr also require a DFT + U correction to be consistently described, and here, we use U (Cr 3d) = 3.5 eV, 60 consistent with values used in other studies.…”
Section: Calculation Methodsmentioning
confidence: 99%